Presentation 2020-12-02
Automation of characteristic measurement of amorphous oxide semiconductor memristors and their effects
Ryo Sumida, Ayata Kurasaki, Mutumi Kimura,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # EID2020-1,SDM2020-35
Date of Issue 2020-11-25 (EID, SDM)

Conference Information
Committee EID / SDM / ITE-IDY
Conference Date 2020/12/2(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Rumiko Yamaguchi(Akita Univ.) / Hiroshige Hirano(TowerPartners Semiconductor)
Vice Chair Masahiro Yamaguchi(Tokyo Inst. of Tech.) / Tomoyuki Ishihara(Japan Display) / Shunichiro Ohmi(Tokyo Inst. of Tech.)
Secretary Masahiro Yamaguchi(NTT) / Tomoyuki Ishihara(NHK) / Shunichiro Ohmi(AIST) / (Nihon Univ.)
Assistant Mutsumi Kimura(Ryukoku Univ.) / Tomokazu Shiga(Univ. of Electro-Comm.) / Hiroko Kominami(Shizuoka Univ.) / Masanobu Mizusaki(SHARP) / Masayuki Kanbara(NAIST) / Taiji Noda(Panasonic) / Tomoyuki Suwa(Tohoku Univ.)

Paper Information
Registration To Technical Committee on Electronic Information Displays / Technical Committee on Silicon Device and Materials / Technical Group on Information Display
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Automation of characteristic measurement of amorphous oxide semiconductor memristors and their effects
Sub Title (in English)
Keyword(1)
1st Author's Name Ryo Sumida
1st Author's Affiliation Ryukoku University(RU)
2nd Author's Name Ayata Kurasaki
2nd Author's Affiliation Ryukoku University(RU)
3rd Author's Name Mutumi Kimura
3rd Author's Affiliation Ryukoku University(RU)
Date 2020-12-02
Paper # EID2020-1,SDM2020-35
Volume (vol) vol.120
Number (no) EID-272,SDM-273
Page pp.pp.1-4(EID), pp.1-4(SDM),
#Pages 4
Date of Issue 2020-11-25 (EID, SDM)