Presentation | 2020-12-02 Automation of characteristic measurement of amorphous oxide semiconductor memristors and their effects Ryo Sumida, Ayata Kurasaki, Mutumi Kimura, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | |
Paper # | EID2020-1,SDM2020-35 |
Date of Issue | 2020-11-25 (EID, SDM) |
Conference Information | |
Committee | EID / SDM / ITE-IDY |
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Conference Date | 2020/12/2(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | Rumiko Yamaguchi(Akita Univ.) / Hiroshige Hirano(TowerPartners Semiconductor) |
Vice Chair | Masahiro Yamaguchi(Tokyo Inst. of Tech.) / Tomoyuki Ishihara(Japan Display) / Shunichiro Ohmi(Tokyo Inst. of Tech.) |
Secretary | Masahiro Yamaguchi(NTT) / Tomoyuki Ishihara(NHK) / Shunichiro Ohmi(AIST) / (Nihon Univ.) |
Assistant | Mutsumi Kimura(Ryukoku Univ.) / Tomokazu Shiga(Univ. of Electro-Comm.) / Hiroko Kominami(Shizuoka Univ.) / Masanobu Mizusaki(SHARP) / Masayuki Kanbara(NAIST) / Taiji Noda(Panasonic) / Tomoyuki Suwa(Tohoku Univ.) |
Paper Information | |
Registration To | Technical Committee on Electronic Information Displays / Technical Committee on Silicon Device and Materials / Technical Group on Information Display |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Automation of characteristic measurement of amorphous oxide semiconductor memristors and their effects |
Sub Title (in English) | |
Keyword(1) | |
1st Author's Name | Ryo Sumida |
1st Author's Affiliation | Ryukoku University(RU) |
2nd Author's Name | Ayata Kurasaki |
2nd Author's Affiliation | Ryukoku University(RU) |
3rd Author's Name | Mutumi Kimura |
3rd Author's Affiliation | Ryukoku University(RU) |
Date | 2020-12-02 |
Paper # | EID2020-1,SDM2020-35 |
Volume (vol) | vol.120 |
Number (no) | EID-272,SDM-273 |
Page | pp.pp.1-4(EID), pp.1-4(SDM), |
#Pages | 4 |
Date of Issue | 2020-11-25 (EID, SDM) |