Presentation 2020-11-20
[Invited Talk] Insights into etching properties of atomic layer etching process for dielectric films
Nobuyuki Kuboi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # SDM2020-32
Date of Issue 2020-11-12 (SDM)

Conference Information
Committee SDM
Conference Date 2020/11/19(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Virtual conference
Topics (in Japanese) (See Japanese page)
Topics (in English) Process, Device, Circuit simulation, etc.
Chair Hiroshige Hirano(TowerPartners Semiconductor)
Vice Chair Shunichiro Ohmi(Tokyo Inst. of Tech.)
Secretary Shunichiro Ohmi(AIST)
Assistant Taiji Noda(Panasonic) / Tomoyuki Suwa(Tohoku Univ.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Talk] Insights into etching properties of atomic layer etching process for dielectric films
Sub Title (in English)
Keyword(1)
Keyword(2)
Keyword(3)
Keyword(4)
Keyword(5)
Keyword(6)
1st Author's Name Nobuyuki Kuboi
1st Author's Affiliation Sony Semiconductor Solutions Corporation(SSS)
Date 2020-11-20
Paper # SDM2020-32
Volume (vol) vol.120
Number (no) SDM-239
Page pp.pp.47-51(SDM),
#Pages 5
Date of Issue 2020-11-12 (SDM)