| Presentation | 2020-11-17 Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | VLD2020-15,ICD2020-35,DC2020-35,RECONF2020-34 |
| Date of Issue | 2020-11-10 (VLD, ICD, DC, RECONF) |
| Conference Information | |
| Committee | VLD / DC / RECONF / ICD / IPSJ-SLDM |
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| Conference Date | 2020/11/17(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2020 -New Field of VLSI Design- |
| Chair | Daisuke Fukuda(Fujitsu Labs.) / Hiroshi Takahashi(Ehime Univ.) / Yuichiro Shibata(Nagasaki Univ.) / Makoto Nagata(Kobe Univ.) / Yuichi Nakamura(NEC) |
| Vice Chair | Kazutoshi Kobayashi(Kyoto Inst. of Tech.) / Tatsuhiro Tsuchiya(Osaka Univ.) / Kentaro Sano(RIKEN) / Yoshiki Yamaguchi(Tsukuba Univ.) / Masafumi Takahashi(masafumi2.takahashi@kioxia.com) |
| Secretary | Kazutoshi Kobayashi(Hitachi) / Tatsuhiro Tsuchiya(Osaka Univ.) / Kentaro Sano(Nihon Univ.) / Yoshiki Yamaguchi(Chiba Univ.) / Masafumi Takahashi(e-trees.Japan) / (NEC) |
| Assistant | Takuma Nishimoto(Hitachi) / / Hiroki Nakahara(Tokyo Inst. of Tech.) / Yukitaka Takemura(INTEL) / Koji Nii(TSMC) / Kosuke Miyaji(Shinshu Univ.) / Takeshi Kuboki(Kyushu Univ.) |
| Paper Information | |
| Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Special Interest Group on System and LSI Design Methodology |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Hikaru Tamaki |
| 1st Author's Affiliation | Ehime University(Ehime Univ.) |
| 2nd Author's Name | Senling Wang |
| 2nd Author's Affiliation | Ehime University(Ehime Univ.) |
| 3rd Author's Name | Yoshinobu Higami |
| 3rd Author's Affiliation | Ehime University(Ehime Univ.) |
| 4th Author's Name | Hiroshi Takahashi |
| 4th Author's Affiliation | Ehime University(Ehime Univ.) |
| 5th Author's Name | Hiroyuki Iwata |
| 5th Author's Affiliation | Renesas Electronics Corporation(Renesas) |
| 6th Author's Name | Yoichi Maeda |
| 6th Author's Affiliation | Renesas Electronics Corporation(Renesas) |
| 7th Author's Name | Jun Matsushima |
| 7th Author's Affiliation | Renesas Electronics Corporation(Renesas) |
| Date | 2020-11-17 |
| Paper # | VLD2020-15,ICD2020-35,DC2020-35,RECONF2020-34 |
| Volume (vol) | vol.120 |
| Number (no) | VLD-234,ICD-235,DC-236,RECONF-237 |
| Page | pp.pp.24-29(VLD), pp.24-29(ICD), pp.24-29(DC), pp.24-29(RECONF), |
| #Pages | 6 |
| Date of Issue | 2020-11-10 (VLD, ICD, DC, RECONF) |