| Presentation | 2020-11-18 Measurement Results of Total Ionizing Dose Effect on Ring Oscillators Fabricated by a Thin-BOX FDSOI Process for Outer-space Mission Takashi Yoshida, Jun Furuta, Kazutoshi Kobayashi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The Total Ionizing Dose (TID) effect is one of the major concerns for semiconductor devices in outer space, where high and low energy particles penetrate to space crafts. The Fully-Depleted Silicon On Insulator (FDSOI) process has brought a significant improvement of electronic devices resilient to soft errors that are major reliability concerns for semiconductor devices in outer space. However, due to the buried oxide (BOX) layer, it becomes more sensitive to TID than a conventional planer bulk process. In this paper, we evaluate TID tolerance of 65 nm thin BOX FDSOI process by measuring Ring Ocillator (RO) frequecy. By comparing the irradiation of α ray and γ ray, it was shown that α ray irradiation that can be done in a laboratory can be used instead of γ ray irradiation that must be done under a secured measurement facility. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Space Craft / Total Ionizing Dose Effect / FDSOI / Ring Oscillator / Gamma-ray / Alpha-ray |
| Paper # | VLD2020-30,ICD2020-50,DC2020-50,RECONF2020-49 |
| Date of Issue | 2020-11-10 (VLD, ICD, DC, RECONF) |
| Conference Information | |
| Committee | VLD / DC / RECONF / ICD / IPSJ-SLDM |
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| Conference Date | 2020/11/17(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2020 -New Field of VLSI Design- |
| Chair | Daisuke Fukuda(Fujitsu Labs.) / Hiroshi Takahashi(Ehime Univ.) / Yuichiro Shibata(Nagasaki Univ.) / Makoto Nagata(Kobe Univ.) / Yuichi Nakamura(NEC) |
| Vice Chair | Kazutoshi Kobayashi(Kyoto Inst. of Tech.) / Tatsuhiro Tsuchiya(Osaka Univ.) / Kentaro Sano(RIKEN) / Yoshiki Yamaguchi(Tsukuba Univ.) / Masafumi Takahashi(masafumi2.takahashi@kioxia.com) |
| Secretary | Kazutoshi Kobayashi(Hitachi) / Tatsuhiro Tsuchiya(Osaka Univ.) / Kentaro Sano(Nihon Univ.) / Yoshiki Yamaguchi(Chiba Univ.) / Masafumi Takahashi(e-trees.Japan) / (NEC) |
| Assistant | Takuma Nishimoto(Hitachi) / / Hiroki Nakahara(Tokyo Inst. of Tech.) / Yukitaka Takemura(INTEL) / Koji Nii(TSMC) / Kosuke Miyaji(Shinshu Univ.) / Takeshi Kuboki(Kyushu Univ.) |
| Paper Information | |
| Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Special Interest Group on System and LSI Design Methodology |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Measurement Results of Total Ionizing Dose Effect on Ring Oscillators Fabricated by a Thin-BOX FDSOI Process for Outer-space Mission |
| Sub Title (in English) | |
| Keyword(1) | Space Craft |
| Keyword(2) | Total Ionizing Dose Effect |
| Keyword(3) | FDSOI |
| Keyword(4) | Ring Oscillator |
| Keyword(5) | Gamma-ray |
| Keyword(6) | Alpha-ray |
| 1st Author's Name | Takashi Yoshida |
| 1st Author's Affiliation | Kyoto Institute of Technology(KIT) |
| 2nd Author's Name | Jun Furuta |
| 2nd Author's Affiliation | Kyoto Institute of Technology(KIT) |
| 3rd Author's Name | Kazutoshi Kobayashi |
| 3rd Author's Affiliation | Kyoto Institute of Technology(KIT) |
| Date | 2020-11-18 |
| Paper # | VLD2020-30,ICD2020-50,DC2020-50,RECONF2020-49 |
| Volume (vol) | vol.120 |
| Number (no) | VLD-234,ICD-235,DC-236,RECONF-237 |
| Page | pp.pp.110-114(VLD), pp.110-114(ICD), pp.110-114(DC), pp.110-114(RECONF), |
| #Pages | 5 |
| Date of Issue | 2020-11-10 (VLD, ICD, DC, RECONF) |