Presentation 2020-10-08
[Poster Presentation] Numerical evaluation of errors in measuring effective area of few mode fibers due to fiber positioning in VAFF method.
Sei-iciro Kida, Yuji Miyoshi, Hirokazu Kubota,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The variable aperture in the far-field (VAFF) method measures power in the far-field passing through a set of circular apertures. However, it is also possible to change the acceptance angle of light by changing the distance to the aperture of a filed size. We report the effect of errors in the position of the fiber end face on the measurement of the effective area by comparing the conventional method and the simplified method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Few mode fibers / VAFF method / Effective Area
Paper # OFT2020-20
Date of Issue 2020-10-01 (OFT)

Conference Information
Committee OFT
Conference Date 2020/10/8(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Yuji Matsuura(Tohoku Univ.)
Vice Chair
Secretary (NTT)
Assistant Hajime Arao(Sumitomo Electric) / Yukihiro Goto(NTT)

Paper Information
Registration To Technical Committee on Optical Fiber Technology
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Poster Presentation] Numerical evaluation of errors in measuring effective area of few mode fibers due to fiber positioning in VAFF method.
Sub Title (in English)
Keyword(1) Few mode fibers
Keyword(2) VAFF method
Keyword(3) Effective Area
1st Author's Name Sei-iciro Kida
1st Author's Affiliation Osaka Prefecture University(Osaka Prefecture Univ.)
2nd Author's Name Yuji Miyoshi
2nd Author's Affiliation Osaka Prefecture University(Osaka Prefecture Univ.)
3rd Author's Name Hirokazu Kubota
3rd Author's Affiliation Osaka Prefecture University(Osaka Prefecture Univ.)
Date 2020-10-08
Paper # OFT2020-20
Volume (vol) vol.120
Number (no) OFT-184
Page pp.pp.46-49(OFT),
#Pages 4
Date of Issue 2020-10-01 (OFT)