Presentation | 2020-10-26 Examination of requirements for power side-channel attack resistance evaluation boards of cryptographic integrated circuits Tomonobu Kan, Kengo Iokibe, Yoshitaka Toyota, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | When evaluating the resistance of a cryptographic circuit to power analysis attacks by measurement, it is not easy to evaluate the IC alone, so the evaluation is performed by mounting the IC on the evaluation board. However, the evaluation board’s specifications are not defined, and even if the same IC is evaluated, the evaluation result may differ depending on the mounted evaluation board. Since it is not possible to determine which evaluation result is credible, it is necessary to unify the evaluation environment. In this study, we consider that side-channel information leakage depends on the transfer impedance, and the purpose is to determine the required specifications of the transfer impedance. In this paper, we show an example in which the evaluation results of side-channel attack resistance differ between the inside of the IC and the substrate, and confirm that the side-channel information leakage depends on the transmission impedance. Using two types of evaluation boards, SASEBO-G and SENPU, the correlation coefficient calculated from the SC leakage waveform measured at the measurement port on the evaluation board was about the same. SENPU, in contrast, had a larger correlation coefficient at the IC level that was calculated from the relational expression between SNR and the correlation coefficient. Comparing the amplitudes of the leaked waveforms, SASEBO-G was 18 times larger. We also calculated the transfer impedance based on the equivalent circuits of the power distribution networks of the FPGA core circuits of both boards. SASEBO-G was larger transfer impedances than SENPU. This result shows that the side-channel information leakage depends on the transfer impedance of the IC power distribution network. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Side-channel attack / Correlation power analysis / AES / Evaluation board / Signal to noise ratio (SNR) / Transfer impedance |
Paper # | HWS2020-25,ICD2020-14 |
Date of Issue | 2020-10-19 (HWS, ICD) |
Conference Information | |
Committee | ICD / HWS |
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Conference Date | 2020/10/26(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Online |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Hardware Security, etc. |
Chair | Makoto Nagata(Kobe Univ.) / Makoto Ikeda(Univ. of Tokyo) |
Vice Chair | Masafumi Takahashi(masafumi2.takahashi@kioxia.com) / Yasuhisa Shimazaki(Renesas Electronics) / Makoto Nagata(Kobe Univ.) |
Secretary | Masafumi Takahashi(Socionext) / Yasuhisa Shimazaki(Osaka Univ.) / Makoto Nagata(Kyushu Univ.) |
Assistant | Koji Nii(TSMC) / Kosuke Miyaji(Shinshu Univ.) / Takeshi Kuboki(Kyushu Univ.) |
Paper Information | |
Registration To | Technical Committee on Integrated Circuits and Devices / Technical Committee on Hardware Security |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Examination of requirements for power side-channel attack resistance evaluation boards of cryptographic integrated circuits |
Sub Title (in English) | PDN transfer impedance contributing to leakage strength |
Keyword(1) | Side-channel attack |
Keyword(2) | Correlation power analysis |
Keyword(3) | AES |
Keyword(4) | Evaluation board |
Keyword(5) | Signal to noise ratio (SNR) |
Keyword(6) | Transfer impedance |
1st Author's Name | Tomonobu Kan |
1st Author's Affiliation | Okayama University(Okayama Univ.) |
2nd Author's Name | Kengo Iokibe |
2nd Author's Affiliation | Okayama University(Okayama Univ.) |
3rd Author's Name | Yoshitaka Toyota |
3rd Author's Affiliation | Okayama University(Okayama Univ.) |
Date | 2020-10-26 |
Paper # | HWS2020-25,ICD2020-14 |
Volume (vol) | vol.120 |
Number (no) | HWS-211,ICD-212 |
Page | pp.pp.1-6(HWS), pp.1-6(ICD), |
#Pages | 6 |
Date of Issue | 2020-10-19 (HWS, ICD) |