Presentation 2020-10-23
[Invited Lecture] Research and development on outage probability prediction of required QoS for factory environment
Kazuto Yano, Norisato Suga, Julian Webber, Yafei Hou, Eiji Nii, Toshihide Higashimori, Yoshinori Suzuki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In order to deploy wireless communication into smart factory environments, it is important to stably operate wireless communication. For realizing this, the authors are conducting research and development of two technologies: prediction of quality of service (QoS) outage, and estimation of a factor causing the QoS outage. This paper briefly introduces the research activities on the prediction of outage probability of application's required QoS. It consists of "future value prediction" and "prediction of QoS outage probability." The former employs probabilistic neural network (PNN), and improves the prediction accuracy by utilizing the measured information obtained on multiple wireless links. The latter estimates QoS outage probability from the prediction result of future QoS value and the estimated distribution function of the QoS prediction error. Some simulation results show the effectiveness of the developed methods.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) future value prediction / outage probability prediction of required QoS / smart factory / machine learning / probabilistic neural network
Paper # RCS2020-108
Date of Issue 2020-10-15 (RCS)

Conference Information
Committee RCS
Conference Date 2020/10/22(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Online
Topics (in Japanese) (See Japanese page)
Topics (in English) Wireless Communication Schemes, Wireless Communication Systems, Wireless Standards, Future Wireless Systems, etc.
Chair Eiji Okamoto(Nagoya Inst. of Tech.)
Vice Chair Fumiaki Maehara(Waseda Univ.) / Toshihiko Nishimura(Hokkaido Univ.) / Tomoya Tandai(Toshiba)
Secretary Fumiaki Maehara(Kyushu Univ.) / Toshihiko Nishimura(NEC) / Tomoya Tandai
Assistant Koichi Adachi(Univ. of Electro-Comm.) / Osamu Nakamura(Sharp) / Manabu Sakai(Mitsubishi Electric) / Masashi Iwabuchi(NTT) / Tatsuki Okuyama(NTT DOCOMO)

Paper Information
Registration To Technical Committee on Radio Communication Systems
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Lecture] Research and development on outage probability prediction of required QoS for factory environment
Sub Title (in English)
Keyword(1) future value prediction
Keyword(2) outage probability prediction of required QoS
Keyword(3) smart factory
Keyword(4) machine learning
Keyword(5) probabilistic neural network
1st Author's Name Kazuto Yano
1st Author's Affiliation Advanced Telecommunications Research Institute International(ATR)
2nd Author's Name Norisato Suga
2nd Author's Affiliation Advanced Telecommunications Research Institute International/Tokyo University of Science(ATR/TUS)
3rd Author's Name Julian Webber
3rd Author's Affiliation Advanced Telecommunications Research Institute International/Osaka University(ATR/Osaka Univ.)
4th Author's Name Yafei Hou
4th Author's Affiliation Advanced Telecommunications Research Institute International/Okayama University(ATR/Okayama Univ.)
5th Author's Name Eiji Nii
5th Author's Affiliation Advanced Telecommunications Research Institute International(ATR)
6th Author's Name Toshihide Higashimori
6th Author's Affiliation Advanced Telecommunications Research Institute International(ATR)
7th Author's Name Yoshinori Suzuki
7th Author's Affiliation Advanced Telecommunications Research Institute International(ATR)
Date 2020-10-23
Paper # RCS2020-108
Volume (vol) vol.120
Number (no) RCS-204
Page pp.pp.86-91(RCS),
#Pages 6
Date of Issue 2020-10-15 (RCS)