| Presentation | 2020-09-28 Fast Scanning Method for Measuring Material Homogeneity using the Line-Focus-Beam Ultrasonic-Material-Characterization System Yuji Ohashi, Yuui Yokota, Akihiro Yamaji, Masao Yoshino, Shunnsuke Kurosawa, Kei Kamada, Hiroki Sato, Satoshi Toyoda, Takashi Hanada, Akira Yoshikawa, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We proposed and demonstrated a new method for measuring material homogeneity using fast scanning technique with the line-focus-beam ultrasonic-material-characterization (LFB-UMC) system. We could successfully obtain similar velocity profile of leaky surface acoustic wave (LSAW) for a Ca3Ta(Ga0.75Al0.25)3Si2O14[CTGAS] single crystal specimen by both of the new V(x) and the conventional V(z) methods. We have verified the new V(x) method was 56 times faster than the conventional V(z) method. Although the V(z) method is superior to the V(x) method in a viewpoint of measurement accuracy, the V(x) method has great advantage that it is possible to quickly evaluate material homogeneity over the wide area of specimen. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Line-focus-beam ultrasonic material characterization (LFB-UMC) system / Leaky surface acoustic wave (LSAW) velocity / V(z) curve analysis / Measuring material homogeneity |
| Paper # | US2020-34 |
| Date of Issue | 2020-09-21 (US) |
| Conference Information | |
| Committee | US |
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| Conference Date | 2020/9/28(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Web Meeting |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Hikaru Miura(Nihon Univ.) |
| Vice Chair | Jun Kondo(Shizuoka Univ.) / Yoshikazu Koike(Shibaura Inst. of Tech.) |
| Secretary | Jun Kondo(Doshisha Univ.) / Yoshikazu Koike(Tohoku Univ.) |
| Assistant | Shinnosuke Hirata(Tokyo Inst. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on Ultrasonics |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fast Scanning Method for Measuring Material Homogeneity using the Line-Focus-Beam Ultrasonic-Material-Characterization System |
| Sub Title (in English) | |
| Keyword(1) | Line-focus-beam ultrasonic material characterization (LFB-UMC) system |
| Keyword(2) | Leaky surface acoustic wave (LSAW) velocity |
| Keyword(3) | V(z) curve analysis |
| Keyword(4) | Measuring material homogeneity |
| 1st Author's Name | Yuji Ohashi |
| 1st Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 2nd Author's Name | Yuui Yokota |
| 2nd Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 3rd Author's Name | Akihiro Yamaji |
| 3rd Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 4th Author's Name | Masao Yoshino |
| 4th Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 5th Author's Name | Shunnsuke Kurosawa |
| 5th Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 6th Author's Name | Kei Kamada |
| 6th Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 7th Author's Name | Hiroki Sato |
| 7th Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 8th Author's Name | Satoshi Toyoda |
| 8th Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 9th Author's Name | Takashi Hanada |
| 9th Author's Affiliation | Tohoku University(Tohoku Univ.) |
| 10th Author's Name | Akira Yoshikawa |
| 10th Author's Affiliation | Tohoku University(Tohoku Univ.) |
| Date | 2020-09-28 |
| Paper # | US2020-34 |
| Volume (vol) | vol.120 |
| Number (no) | US-174 |
| Page | pp.pp.41-44(US), |
| #Pages | 4 |
| Date of Issue | 2020-09-21 (US) |