| Presentation | 2020-07-02 Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The threat of electromagnetic (EM) information leakage has been focused on the acquisition of information inside the devices, which is contained in the EM fields emitted unintentionally during the operations of the devices. In contrast, this paper focuses on information leakage caused by EM emission generated by intentional electromagnetic interference. Specifically, this paper focuses on USB keyboards, which are widely used as input/output devices. It is shown that the leakage of information can be controlled by increasing the intensity of the radiated EM fields by increasing the intensity of the disturbance of a specific frequency, which includes the data processed in the keyboard. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | EM information leakage / Intentional electromagnetic interference |
| Paper # | EMCJ2020-15 |
| Date of Issue | 2020-06-25 (EMCJ) |
| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2020/7/2(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Young Scientist Meeting |
| Chair | Kensei Oh(Nagoya Inst. of Tech.) |
| Vice Chair | Atsuhiro Nishikata(Tokyo Inst. of Tech.) |
| Secretary | Atsuhiro Nishikata(Denso) |
| Assistant | Nami Sasaki(Seiwa Electric MFG) / Hiroyoshi Shida(Tokin EMC Engineering) / Sho Muroga(Akita Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference |
| Sub Title (in English) | |
| Keyword(1) | EM information leakage |
| Keyword(2) | Intentional electromagnetic interference |
| 1st Author's Name | Shugo Kaji |
| 1st Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 2nd Author's Name | Daisuke Fujimoto |
| 2nd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 3rd Author's Name | Yuichi Hayashi |
| 3rd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| Date | 2020-07-02 |
| Paper # | EMCJ2020-15 |
| Volume (vol) | vol.120 |
| Number (no) | EMCJ-83 |
| Page | pp.pp.25-28(EMCJ), |
| #Pages | 4 |
| Date of Issue | 2020-06-25 (EMCJ) |