Presentation 2020-05-15
Experimental Results on Ethernet Communication Degradation by Pulse Disturbances (Part 1)
Minseong Lee, Yusuke Yano, Osami Wada,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Recently, Ethernet communications have been attracting attention as high-speed and large-capacity communication methods with an increase in the amount of information handled in in-vehicle networks. Immunity tests are required to ensure the reliability and safety of in-vehicle communication devices. Although pulse disturbances used for in-vehicle Ethernet immunity tests have been specified, the characteristics of disturbances that cause communication quality degradation and the cause of malfunction that occur when disturbances are applied have not been elucidated. To improve the immunity test reliability and shorten the test time, it is necessary to elucidate the relation between communication quality and parameters of disturbances and the mechanism of malfunction caused by pulse disturbances. In this report, as an early study, we focus on the consumer Ethernet communication standards 100BASE-TX and 1000BASE-T. To investigate the relation between the pulse parameters and communication quality and the mechanism, we conducted an experiment to apply pulse disturbances in differential mode to the differential communication lines. As a result, we found the differences in the parameters of the pulse disturbances to cause degradation of communication quality. Also, the data errors were observed that were inferred to result from different mechanisms in each standard.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Ethernet / Pulse disturbance / 100BASE-TX / 1000BASE-T / Immunity
Paper # EMCJ2020-9
Date of Issue 2020-05-08 (EMCJ)

Conference Information
Committee EMCJ
Conference Date 2020/5/15(1days)
Place (in Japanese) (See Japanese page)
Place (in English) SEIWA ELECTRIC MFG
Topics (in Japanese) (See Japanese page)
Topics (in English) EMC
Chair Kensei Oh(Nagoya Inst. of Tech.)
Vice Chair Atsuhiro Nishikata(Tokyo Inst. of Tech.)
Secretary Atsuhiro Nishikata(Tokyo Inst. of Tech.)
Assistant Nami Sasaki(Seiwa Electric MFG) / Hiroyoshi Shida(Tokin EMC Engineering) / Sho Muroga(Akita Univ.)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Experimental Results on Ethernet Communication Degradation by Pulse Disturbances (Part 1)
Sub Title (in English) 100BASE-TX and 1000BASE-T
Keyword(1) Ethernet
Keyword(2) Pulse disturbance
Keyword(3) 100BASE-TX
Keyword(4) 1000BASE-T
Keyword(5) Immunity
1st Author's Name Minseong Lee
1st Author's Affiliation Kyoto University(Kyoto Univ.)
2nd Author's Name Yusuke Yano
2nd Author's Affiliation Kyoto University(Kyoto Univ.)
3rd Author's Name Osami Wada
3rd Author's Affiliation Kyoto University(Kyoto Univ.)
Date 2020-05-15
Paper # EMCJ2020-9
Volume (vol) vol.120
Number (no) EMCJ-20
Page pp.pp.27-32(EMCJ),
#Pages 6
Date of Issue 2020-05-08 (EMCJ)