| Presentation | 2020-05-15 Experimental Results on Ethernet Communication Degradation by Pulse Disturbances (Part 1) Minseong Lee, Yusuke Yano, Osami Wada, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Recently, Ethernet communications have been attracting attention as high-speed and large-capacity communication methods with an increase in the amount of information handled in in-vehicle networks. Immunity tests are required to ensure the reliability and safety of in-vehicle communication devices. Although pulse disturbances used for in-vehicle Ethernet immunity tests have been specified, the characteristics of disturbances that cause communication quality degradation and the cause of malfunction that occur when disturbances are applied have not been elucidated. To improve the immunity test reliability and shorten the test time, it is necessary to elucidate the relation between communication quality and parameters of disturbances and the mechanism of malfunction caused by pulse disturbances. In this report, as an early study, we focus on the consumer Ethernet communication standards 100BASE-TX and 1000BASE-T. To investigate the relation between the pulse parameters and communication quality and the mechanism, we conducted an experiment to apply pulse disturbances in differential mode to the differential communication lines. As a result, we found the differences in the parameters of the pulse disturbances to cause degradation of communication quality. Also, the data errors were observed that were inferred to result from different mechanisms in each standard. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Ethernet / Pulse disturbance / 100BASE-TX / 1000BASE-T / Immunity |
| Paper # | EMCJ2020-9 |
| Date of Issue | 2020-05-08 (EMCJ) |
| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2020/5/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | SEIWA ELECTRIC MFG |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | EMC |
| Chair | Kensei Oh(Nagoya Inst. of Tech.) |
| Vice Chair | Atsuhiro Nishikata(Tokyo Inst. of Tech.) |
| Secretary | Atsuhiro Nishikata(Tokyo Inst. of Tech.) |
| Assistant | Nami Sasaki(Seiwa Electric MFG) / Hiroyoshi Shida(Tokin EMC Engineering) / Sho Muroga(Akita Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Experimental Results on Ethernet Communication Degradation by Pulse Disturbances (Part 1) |
| Sub Title (in English) | 100BASE-TX and 1000BASE-T |
| Keyword(1) | Ethernet |
| Keyword(2) | Pulse disturbance |
| Keyword(3) | 100BASE-TX |
| Keyword(4) | 1000BASE-T |
| Keyword(5) | Immunity |
| 1st Author's Name | Minseong Lee |
| 1st Author's Affiliation | Kyoto University(Kyoto Univ.) |
| 2nd Author's Name | Yusuke Yano |
| 2nd Author's Affiliation | Kyoto University(Kyoto Univ.) |
| 3rd Author's Name | Osami Wada |
| 3rd Author's Affiliation | Kyoto University(Kyoto Univ.) |
| Date | 2020-05-15 |
| Paper # | EMCJ2020-9 |
| Volume (vol) | vol.120 |
| Number (no) | EMCJ-20 |
| Page | pp.pp.27-32(EMCJ), |
| #Pages | 6 |
| Date of Issue | 2020-05-08 (EMCJ) |