| Presentation | 2020-07-17 Production of automatic measurement system for contact resistance and its measurement results Kiyoshi Yoshida, Koichiro Sawa, Kenji Suzuki, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this study, we constructed an automatic measurement system for the contact resistance of electrical contacts. This system used measurement control software LabVIEW (National Instruments). In the experiments, the contact resistance of two types of electrical contacts mounted on the electromagnetic contactor was measured up to one million operations. The electromagnetic contactor has a total of four electrical contacts, two single contacts and two twin contacts. The experimental conditions were as follows: the power supply voltage was constant at 5 V, and the current was set at 10 mA. The open and close operation were set to 3 Hz, and the contact resistance was measured 10 times every 2000 times operation, and the average value was obtained. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Automatic Measurement / Contact Resistance / LabVIEW, / Electromagnetic Contactor / Electrical Contact / Twin Contact / Single Contact |
| Paper # | EMD2020-6 |
| Date of Issue | 2020-07-10 (EMD) |
| Conference Information | |
| Committee | EMD |
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| Conference Date | 2020/7/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Chitose-Arcadia-Plaza |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Yoshiki Kayano(Univ. of Electro-Comm.) |
| Vice Chair | |
| Secretary | (Nippon Inst. of Tech.) |
| Assistant | Yuichi Hayashi(ＮＡＩＳＴ) / Kazuaki Miyanaga(Fujitsu Component) |
| Paper Information | |
| Registration To | Technical Committee on Electromechanical Devices |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Production of automatic measurement system for contact resistance and its measurement results |
| Sub Title (in English) | Contact resistance when switching 1 million times under small load condition |
| Keyword(1) | Automatic Measurement |
| Keyword(2) | Contact Resistance |
| Keyword(3) | LabVIEW, |
| Keyword(4) | Electromagnetic Contactor |
| Keyword(5) | Electrical Contact |
| Keyword(6) | Twin Contact |
| Keyword(7) | Single Contact |
| 1st Author's Name | Kiyoshi Yoshida |
| 1st Author's Affiliation | Nippon Institute of Technology(NIT) |
| 2nd Author's Name | Koichiro Sawa |
| 2nd Author's Affiliation | Nippon Institute of Technology(NIT) |
| 3rd Author's Name | Kenji Suzuki |
| 3rd Author's Affiliation | Fuji Electric FA Components & Systems(Fuji FA Comp. & Sys.) |
| Date | 2020-07-17 |
| Paper # | EMD2020-6 |
| Volume (vol) | vol.120 |
| Number (no) | EMD-110 |
| Page | pp.pp.17-22(EMD), |
| #Pages | 6 |
| Date of Issue | 2020-07-10 (EMD) |