| Presentation | 2020-05-21 Plasmon Response Analysis of Thin Film Structure for Development of Magnetic Sensing Tomohiro Tamaru, Hironori Shibagaki, Di Wu, Seiya Kishimoto, Yoshito Ashizawa, Katsuji Nakagawa, Shinichiro Ohnuki, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Electromagnetic field analysis of the Kretschmann arrangement using a mixed thin film composed of multiple metal media is performed. The optimized structure of the thin film used for the mixed medium is clarified by comparing the reflectance and plasmon excitation intensity. The magnetic sensing application of the surface plasmon sensor is examined. Assuming a thin film structure consisting of a metal for plasmon excitation and a magnetic material, we compare the reflectance and plasmon excitation intensity when the magnetic material causes a change in the dielectric constant due to external magnetic field. Since the reflection characteristics are sensitive to the change in the dielectric constant, the structure that reacts to magnetic fields is clarified. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Magnetic sensing / Surface Plasmon Resonance / Kretschmann Arrangement / Magneto-optical effect / Finite-Difference Frequency-Domain Method |
| Paper # | EST2020-5 |
| Date of Issue | 2020-05-14 (EST) |
| Conference Information | |
| Committee | EST |
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| Conference Date | 2020/5/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Shinichiro Ohnuki(Nihon Univ.) |
| Vice Chair | Masayuki Kimishima(Advantest) / Jun Shibayama(Hosei Univ.) / Yasuhide Tsuji(Muroran Institute of Technology) |
| Secretary | Masayuki Kimishima(Aoyama Gakuin Univ.) / Jun Shibayama(ENRI) / Yasuhide Tsuji |
| Assistant | Hidenori Ishibashi(Mitsubishi Electric) / Seiya Kishimoto(Nihon Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Electronics Simulation Technology |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Plasmon Response Analysis of Thin Film Structure for Development of Magnetic Sensing |
| Sub Title (in English) | |
| Keyword(1) | Magnetic sensing |
| Keyword(2) | Surface Plasmon Resonance |
| Keyword(3) | Kretschmann Arrangement |
| Keyword(4) | Magneto-optical effect |
| Keyword(5) | Finite-Difference Frequency-Domain Method |
| 1st Author's Name | Tomohiro Tamaru |
| 1st Author's Affiliation | Nihon University(Nihon Univ.) |
| 2nd Author's Name | Hironori Shibagaki |
| 2nd Author's Affiliation | Nihon University(Nihon Univ.) |
| 3rd Author's Name | Di Wu |
| 3rd Author's Affiliation | Nihon University(Nihon Univ.) |
| 4th Author's Name | Seiya Kishimoto |
| 4th Author's Affiliation | Nihon University(Nihon Univ.) |
| 5th Author's Name | Yoshito Ashizawa |
| 5th Author's Affiliation | Nihon University(Nihon Univ.) |
| 6th Author's Name | Katsuji Nakagawa |
| 6th Author's Affiliation | Nihon University(Nihon Univ.) |
| 7th Author's Name | Shinichiro Ohnuki |
| 7th Author's Affiliation | Nihon University(Nihon Univ.) |
| Date | 2020-05-21 |
| Paper # | EST2020-5 |
| Volume (vol) | vol.120 |
| Number (no) | EST-31 |
| Page | pp.pp.23-28(EST), |
| #Pages | 6 |
| Date of Issue | 2020-05-14 (EST) |