Presentation 2020-02-07
[Invited Talk] Nanophotonics contributions to state-of-the-art CMOS Image Sensors
Sozo Yokogawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Recent progress of Back-illuminated CMOS image sensor (BI-CIS), focusing on their pixel improvements with design of optical properties using subwavelength sizescale structures and photonics technologies, are reviewed. These technologies contribute not only improving BI-CIS basic performances but also adding new functions for versatile sensing applications. The contents were presented as an invited talk at 2019 IEEE International Electron Device Meeting (IEDM).
Keyword(in Japanese) (See Japanese page)
Keyword(in English) CMOS / Image Sensor / Photonics
Paper # SDM2019-97
Date of Issue 2020-01-31 (SDM)

Conference Information
Committee SDM
Conference Date 2020/2/7(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Tokyo University-Hongo
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Takahiro Shinada(Tohoku Univ.)
Vice Chair Hiroshige Hirano(TowerJazz Panasonic)
Secretary Hiroshige Hirano(Shizuoka Univ.)
Assistant Takahiro Mori(AIST) / Nobuaki Kobayashi(Nihon Univ.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Talk] Nanophotonics contributions to state-of-the-art CMOS Image Sensors
Sub Title (in English)
Keyword(1) CMOS
Keyword(2) Image Sensor
Keyword(3) Photonics
1st Author's Name Sozo Yokogawa
1st Author's Affiliation Sony Semiconductor Solutions Corporation(SSS)
Date 2020-02-07
Paper # SDM2019-97
Volume (vol) vol.119
Number (no) SDM-410
Page pp.pp.39-43(SDM),
#Pages 5
Date of Issue 2020-01-31 (SDM)