| Presentation | 2020-02-26 Improving Controllability of Signal Transitions in the High Switching Area of LSI Jie Shi, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Power consumption in LSI testing is larger than in functional mode. High power consumption causes excessive IR-drop and excessive delay resulting in test malfunction. On the other hand, extremely lower power than in functional mode may reduce detectability of small delay fault. Therefore, LSI test requires appropriate power consumption. The purpose of this work is to improve controllability of power consumption in LSI testing by applying power controlling techniques in specified areas. In this work, we examine the controllability of power consumption in the specified areas. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | at-speed testing / transition delay test / test malfunction / power consumption in LSI testing / controlling test power |
| Paper # | DC2019-94 |
| Date of Issue | 2020-02-19 (DC) |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2020/2/26(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Vice Chair | Hiroshi Takahashi(Ehime Univ.) |
| Secretary | Hiroshi Takahashi(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improving Controllability of Signal Transitions in the High Switching Area of LSI |
| Sub Title (in English) | |
| Keyword(1) | at-speed testing |
| Keyword(2) | transition delay test |
| Keyword(3) | test malfunction |
| Keyword(4) | power consumption in LSI testing |
| Keyword(5) | controlling test power |
| 1st Author's Name | Jie Shi |
| 1st Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 2nd Author's Name | Kohei Miyase |
| 2nd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 3rd Author's Name | Xiaoqing Wen |
| 3rd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 4th Author's Name | Seiji Kajihara |
| 4th Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| Date | 2020-02-26 |
| Paper # | DC2019-94 |
| Volume (vol) | vol.119 |
| Number (no) | DC-420 |
| Page | pp.pp.49-54(DC), |
| #Pages | 6 |
| Date of Issue | 2020-02-19 (DC) |