| Presentation | 2020-02-26 Power Analysis for Logic Area of LSI Including Memory Area Yuya Kodama, Kohei Miyase, Daiki Takafuji, Xiaoqing Wen, Seiji Kajihara, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Power consumption during LSI testing is higher than functional mode. Excessive IR-drop causes excessive delay, resulting in over-testing in particular for at-speed testing. Over-testing is directly related to yield loss. Therefore, test power reduction and efficient power analysis is required. Since excessive IR-drop does not occur in whole area of LSI, locating an area with high IR-drop is very important. Although an LSI includes memory design in general, academic version of benchmark logic circuits does not have memories.In this work, we analyze power consumption for a logic part of LSI including memory design. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | at-speed testing / test power / IR-drop / over-testing / power analysis |
| Paper # | DC2019-93 |
| Date of Issue | 2020-02-19 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2020/2/26(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Vice Chair | Hiroshi Takahashi(Ehime Univ.) |
| Secretary | Hiroshi Takahashi(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Power Analysis for Logic Area of LSI Including Memory Area |
| Sub Title (in English) | |
| Keyword(1) | at-speed testing |
| Keyword(2) | test power |
| Keyword(3) | IR-drop |
| Keyword(4) | over-testing |
| Keyword(5) | power analysis |
| 1st Author's Name | Yuya Kodama |
| 1st Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 2nd Author's Name | Kohei Miyase |
| 2nd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 3rd Author's Name | Daiki Takafuji |
| 3rd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 4th Author's Name | Xiaoqing Wen |
| 4th Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 5th Author's Name | Seiji Kajihara |
| 5th Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| Date | 2020-02-26 |
| Paper # | DC2019-93 |
| Volume (vol) | vol.119 |
| Number (no) | DC-420 |
| Page | pp.pp.43-48(DC), |
| #Pages | 6 |
| Date of Issue | 2020-02-19 (DC) |