| Presentation | 2020-02-26 Defective Chip Prediction Modeling Using Convolutional Neural Networks Ryunosuke Oka, Satoshi Ohtake, Kouichi Kumaki, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In recent years, the cost of LSI testing which guarantees reliability has relatively increased due to the development of high integration technology and lower prices. So far, method to defective prediction modeling for test cost reduction using data mining techniques such as machine learning has been proposed. This paper propose a method to improve the discrimination accuracy of defective prediction models by applying convolutional neural networks (CNN) which is one of the recent deep learning techniques. We expected to automate complicated data analysis and feature engineering with highly accurate defective prediction by utilizing the feature extraction structure of CNN. In addition, we investigate a new cost reduction method based on defective prediction considering yield rate. The effectiveness of the proposed method is shown by experimental results using actual manufacturing data. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Data mining / LSI testing / Convolutional neural network / Defective prediction |
| Paper # | DC2019-87 |
| Date of Issue | 2020-02-19 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2020/2/26(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Vice Chair | Hiroshi Takahashi(Ehime Univ.) |
| Secretary | Hiroshi Takahashi(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Defective Chip Prediction Modeling Using Convolutional Neural Networks |
| Sub Title (in English) | |
| Keyword(1) | Data mining |
| Keyword(2) | LSI testing |
| Keyword(3) | Convolutional neural network |
| Keyword(4) | Defective prediction |
| 1st Author's Name | Ryunosuke Oka |
| 1st Author's Affiliation | Oita University(Oita Univ.) |
| 2nd Author's Name | Satoshi Ohtake |
| 2nd Author's Affiliation | Oita University(Oita Univ.) |
| 3rd Author's Name | Kouichi Kumaki |
| 3rd Author's Affiliation | Renesas Electronics Corporation(Renesas) |
| Date | 2020-02-26 |
| Paper # | DC2019-87 |
| Volume (vol) | vol.119 |
| Number (no) | DC-420 |
| Page | pp.pp.7-12(DC), |
| #Pages | 6 |
| Date of Issue | 2020-02-19 (DC) |