| Presentation | 2020-02-26 A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki, Masayoshi Yoshimura, Masayuki Arai, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test generation methods using X-identification and X-filling techniques have been proposed to reduce capture power dissipation. Optimization problems for these two techniques to reduce low capture power dissipation are independently considered. Therefore, the efficiency of low capture power test generation using X-filling depends on the applied results of X-identification. In this paper, we propose an X-identification-filling co-optimization method to reduce the number of capture-unsafe test vectors using Partial MaxSAT Solver. The method assigns logic values to X-bits in order to justify values assigned to propagate target faults to pseudo primary outputs and to reduce the number of transitions on as many internal signal lines as possible. Experimental results show that our proposed method reduced the number of capture unsafe test vectors by 31.63% and the number of unsafe faults by 31.84% on average. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | X-identification-filling co-optimization / low capture power / Partial MaxSAT / capture-unsafe test vectors / unsafe faults |
| Paper # | DC2019-92 |
| Date of Issue | 2020-02-19 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2020/2/26(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Vice Chair | Hiroshi Takahashi(Ehime Univ.) |
| Secretary | Hiroshi Takahashi(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT |
| Sub Title (in English) | |
| Keyword(1) | X-identification-filling co-optimization |
| Keyword(2) | low capture power |
| Keyword(3) | Partial MaxSAT |
| Keyword(4) | capture-unsafe test vectors |
| Keyword(5) | unsafe faults |
| 1st Author's Name | Kenichiro Misawa |
| 1st Author's Affiliation | Nihon Univercity(Nihon Univ) |
| 2nd Author's Name | Toshinori Hosokawa |
| 2nd Author's Affiliation | Nihon Univercity(Nihon Univ) |
| 3rd Author's Name | Hiroshi Yamazaki |
| 3rd Author's Affiliation | Nihon Univercity(Nihon Univ) |
| 4th Author's Name | Masayoshi Yoshimura |
| 4th Author's Affiliation | Kyouto Sangyo Univercity(Kyouto Sangyo Univ) |
| 5th Author's Name | Masayuki Arai |
| 5th Author's Affiliation | Nihon Univercity(Nihon Univ) |
| Date | 2020-02-26 |
| Paper # | DC2019-92 |
| Volume (vol) | vol.119 |
| Number (no) | DC-420 |
| Page | pp.pp.37-42(DC), |
| #Pages | 6 |
| Date of Issue | 2020-02-19 (DC) |