Presentation 2020-01-17
[Poster Presentation] Simulation and Experimental Evaluation of Bit Error Rates of Adiabatic Quantum Flux Parametron Circuits Including Thermal Noises
Daiki Ito, Naoki Takeuchi, Yuki Yamanashi, Nobuyuki Yoshikawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # SCE2019-57
Date of Issue 2020-01-09 (SCE)

Conference Information
Committee SCE
Conference Date 2020/1/16(2days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Satoshi Kohjiro(AIST)
Vice Chair
Secretary (Yokohama National Univ.)
Assistant Hiroyuki Akaike(Daido Univ.)

Paper Information
Registration To Technical Committee on Superconductive Electronics
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Poster Presentation] Simulation and Experimental Evaluation of Bit Error Rates of Adiabatic Quantum Flux Parametron Circuits Including Thermal Noises
Sub Title (in English)
Keyword(1)
1st Author's Name Daiki Ito
1st Author's Affiliation Department of Electrical and Computer Engineering , Yokohama National University(YNU)
2nd Author's Name Naoki Takeuchi
2nd Author's Affiliation Institute of Advanced Sciences, Yokohama National University(IAS)
3rd Author's Name Yuki Yamanashi
3rd Author's Affiliation Department of Electrical and Computer Engineering , Yokohama National University(YNU)
4th Author's Name Nobuyuki Yoshikawa
4th Author's Affiliation Department of Electrical and Computer Engineering , Yokohama National University(YNU)
Date 2020-01-17
Paper # SCE2019-57
Volume (vol) vol.119
Number (no) SCE-369
Page pp.pp.111-115(SCE),
#Pages 5
Date of Issue 2020-01-09 (SCE)