| Presentation | 2020-01-24 Relative complex permittivity measurement aiming for deterioration diagnosis of ceiling panel material due to contained moisture Teppei Sudo, Atsuhiro Nishikata, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | EMCJ2019-88 |
| Date of Issue | 2020-01-17 (EMCJ) |
| Conference Information | |
| Committee | EMCJ / IEE-EMC |
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| Conference Date | 2020/1/24(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Kensei Oh(Nagoya Inst. of Tech.) / Ken-ichi Yamazaki(電中研) |
| Vice Chair | Atsuhiro Nishikata(Tokyo Inst. of Tech.) / Shinobu Ishigami(東北学院大) / Masateru Ikehata(鉄道総研) |
| Secretary | Atsuhiro Nishikata(Tokyo Inst. of Tech.) / Shinobu Ishigami(Denso) / Masateru Ikehata |
| Assistant | Nami Sasaki(Seiwa Electric MFG) / Hiroyoshi Shida(Tokin EMC Engineering) / Sho Muroga(Akita Univ.) / Takaaki Ibuchi(阪大) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility / Technical Meeting on Electromagnetic Compatibility |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Relative complex permittivity measurement aiming for deterioration diagnosis of ceiling panel material due to contained moisture |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Teppei Sudo |
| 1st Author's Affiliation | Tokyo Institute of Technology(Tokyo Tech) |
| 2nd Author's Name | Atsuhiro Nishikata |
| 2nd Author's Affiliation | Tokyo Institute of Technology(Tokyo Tech) |
| Date | 2020-01-24 |
| Paper # | EMCJ2019-88 |
| Volume (vol) | vol.119 |
| Number (no) | EMCJ-387 |
| Page | pp.pp.41-45(EMCJ), |
| #Pages | 5 |
| Date of Issue | 2020-01-17 (EMCJ) |