Presentation 2020-01-24
A study of chattering in a high-side MOS-FET gate driver circuit
Takumi Ogura, Takuji Kousaka, Daisuke Itou,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A high-side gate driver circuit is used for switching converters to normally operate power MOS-FETs, but it is reported that charter switching occurs due to the miss-mathing of circuit conditions. They will cause the degradation of the stability of a power source, therefore this report investigates charter switching of MOS-FETs in simple high-side gate drivers.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) chattering / high-side gate driver
Paper # NLP2019-94
Date of Issue 2020-01-16 (NLP)

Conference Information
Committee NLP / NC
Conference Date 2020/1/23(3days)
Place (in Japanese) (See Japanese page)
Place (in English) Miyakojima Marine Terminal
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Hiroaki Kurokawa(Tokyo Univ. of Tech.) / Hayaru Shouno(UEC)
Vice Chair Kiyohisa Natsume(Kyushu Inst. of Tech.) / Kazuyuki Samejima(Tamagawa Univ)
Secretary Kiyohisa Natsume(Nippon Inst. of Tech.) / Kazuyuki Samejima(Kyushu Inst. of Tech.)
Assistant Yutaka Shimada(Saitama Univ.) / Toshikaza Samura(Yamaguchi Univ.) / Takashi Shinozaki(NICT) / Ken Takiyama(TUAT)

Paper Information
Registration To Technical Committee on Nonlinear Problems / Technical Committee on Neurocomputing
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A study of chattering in a high-side MOS-FET gate driver circuit
Sub Title (in English)
Keyword(1) chattering
Keyword(2) high-side gate driver
1st Author's Name Takumi Ogura
1st Author's Affiliation Chukyo University(Chukyo Univ.)
2nd Author's Name Takuji Kousaka
2nd Author's Affiliation Chukyo University(Chukyo Univ.)
3rd Author's Name Daisuke Itou
3rd Author's Affiliation Gifu University(Gifu Univ.)
Date 2020-01-24
Paper # NLP2019-94
Volume (vol) vol.119
Number (no) NLP-381
Page pp.pp.49-52(NLP),
#Pages 4
Date of Issue 2020-01-16 (NLP)