Presentation 2019-12-24
A Study on Unit Testing Method of eMMC Storage Devices
Yoshinobu Nagase,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) eMMC storage devices are widely deployed for consumer electronic products such as digital cameras and smart phones. So far, the testing of eMMC storage devices was costly in manufacturing and deployment scenes because it needed the implementation work of dedicated printed circuit boards. In this paper, I propose a new unit performance testing method for eMMC storage device, which is characterized by a process of observing response time of commands issued by a host controller. This paper presents the effectiveness of the proposed testing method by reporting an experiment that I conducted.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) eMMC / performance testing
Paper # DE2019-29
Date of Issue 2019-12-16 (DE)

Conference Information
Committee DE / IPSJ-DBS
Conference Date 2019/12/23(2days)
Place (in Japanese) (See Japanese page)
Place (in English) National Institute of Informatics
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Jun Miyazaki(Tokyo Inst. of Tech.) / 吉川 正俊(京大)
Vice Chair Shohei Yokoyama(Tokyo Metropolitan Univ.) / Kazuo Goda(Univ. of Tokyo)
Secretary Shohei Yokoyama(NTT) / Kazuo Goda(Univ. of Hyogo) / (筑波大)
Assistant Saneyasu Yamaguchi(Kogakuin Univ.) / Shoko Wakamiya(NAIST)

Paper Information
Registration To Technical Committee on Data Engineering / Special Interest Group on Database System
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study on Unit Testing Method of eMMC Storage Devices
Sub Title (in English)
Keyword(1) eMMC
Keyword(2) performance testing
1st Author's Name Yoshinobu Nagase
1st Author's Affiliation JVCKENWOOD Corporation(JVCKENWOOD)
Date 2019-12-24
Paper # DE2019-29
Volume (vol) vol.119
Number (no) DE-354
Page pp.pp.55-60(DE),
#Pages 6
Date of Issue 2019-12-16 (DE)