Presentation 2019-11-13
Design of Reference-free CMOS Temperature Sensor with Statistical MOSFET Selection
Shogo Harada, Mahfuzul Islam, Takashi Hisakado, Osami Wada,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The need for low power temperature sensors that can operate under limited power supply has been increasing. One of the low-power sensing method is to utilize the temperature characteristic difference between two MOSFETs that are biased at different voltages. However, often these techniques require a stable reference voltage. The generation of a stable reference voltage causes area and power overhead. Here we propose a temperature sensing mechanism in which we statistically select a pair of MOSFETs having an appropriate threshold voltage difference. Utilizing the threshold voltage difference as the reference, the proposed method eliminates the need for precise voltage reference, thus realizes low-cost and low-power operation.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Temperature sensor / MOSFET / normal distribution / sub-threshold characteristics
Paper # VLD2019-34,DC2019-58
Date of Issue 2019-11-06 (VLD, DC)

Conference Information
Committee VLD / DC / CPSY / RECONF / ICD / IE / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC
Conference Date 2019/11/13(3days)
Place (in Japanese) (See Japanese page)
Place (in English) Ehime Prefecture Gender Equality Center
Topics (in Japanese) (See Japanese page)
Topics (in English) Design Gaia 2019 -New Field of VLSI Design-
Chair Nozomu Togawa(Waseda Univ.) / Satoshi Fukumoto(Tokyo Metropolitan Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Yuichiro Shibata(Nagasaki Univ.) / Makoto Nagata(Kobe Univ.) / Hideaki Kimata(NTT) / Yutaka Tamiya(Fujitsu Lab.) / / Hiroshi Inoue(Kyushu Univ.)
Vice Chair Daisuke Fukuda(Fujitsu Labs.) / Hiroshi Takahashi(Ehime Univ.) / Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Kentaro Sano(RIKEN) / Yoshiki Yamaguchi(Tsukuba Univ.) / Masafumi Takahashi(Toshiba-memory) / Kazuya Kodama(NII) / Keita Takahashi(Nagoya Univ.)
Secretary Daisuke Fukuda(Univ. of Aizu) / Hiroshi Takahashi(Hitachi) / Michihiro Koibuchi(Nihon Univ.) / Kota Nakajima(Chiba Univ.) / Kentaro Sano(Nagoya Inst. of Tech.) / Yoshiki Yamaguchi(Hokkaido Univ.) / Masafumi Takahashi(Hiroshima City Univ.) / Kazuya Kodama(e-trees.Japan) / Keita Takahashi(Tohoku Univ.) / (Socionext) / (NTT) / (NHK)
Assistant Kazuki Ikeda(Hitachi) / / Eiji Arima(Univ. of Tokyo) / Shugo Ogawa(Hitachi) / Yuuki Kobayashi(NEC) / Hiroki Nakahara(Tokyo Inst. of Tech.) / Tetsuya Hirose(Osaka Univ.) / Koji Nii(Floadia) / Takeshi Kuboki(Kyushu Univ.) / Kyohei Unno(KDDI Research) / Norishige Fukushima(Nagoya Inst. of Tech.)

Paper Information
Registration To Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Technical Committee on Image Engineering / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Design of Reference-free CMOS Temperature Sensor with Statistical MOSFET Selection
Sub Title (in English)
Keyword(1) Temperature sensor
Keyword(2) MOSFET
Keyword(3) normal distribution
Keyword(4) sub-threshold characteristics
1st Author's Name Shogo Harada
1st Author's Affiliation Kyoto University(Kyoto Univ.)
2nd Author's Name Mahfuzul Islam
2nd Author's Affiliation Kyoto University(Kyoto Univ.)
3rd Author's Name Takashi Hisakado
3rd Author's Affiliation Kyoto University(Kyoto Univ.)
4th Author's Name Osami Wada
4th Author's Affiliation Kyoto University(Kyoto Univ.)
Date 2019-11-13
Paper # VLD2019-34,DC2019-58
Volume (vol) vol.119
Number (no) VLD-282,DC-283
Page pp.pp.51-56(VLD), pp.51-56(DC),
#Pages 6
Date of Issue 2019-11-06 (VLD, DC)