Presentation | 2019-11-13 Design of Reference-free CMOS Temperature Sensor with Statistical MOSFET Selection Shogo Harada, Mahfuzul Islam, Takashi Hisakado, Osami Wada, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The need for low power temperature sensors that can operate under limited power supply has been increasing. One of the low-power sensing method is to utilize the temperature characteristic difference between two MOSFETs that are biased at different voltages. However, often these techniques require a stable reference voltage. The generation of a stable reference voltage causes area and power overhead. Here we propose a temperature sensing mechanism in which we statistically select a pair of MOSFETs having an appropriate threshold voltage difference. Utilizing the threshold voltage difference as the reference, the proposed method eliminates the need for precise voltage reference, thus realizes low-cost and low-power operation. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Temperature sensor / MOSFET / normal distribution / sub-threshold characteristics |
Paper # | VLD2019-34,DC2019-58 |
Date of Issue | 2019-11-06 (VLD, DC) |
Conference Information | |
Committee | VLD / DC / CPSY / RECONF / ICD / IE / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC |
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Conference Date | 2019/11/13(3days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Ehime Prefecture Gender Equality Center |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Design Gaia 2019 -New Field of VLSI Design- |
Chair | Nozomu Togawa(Waseda Univ.) / Satoshi Fukumoto(Tokyo Metropolitan Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Yuichiro Shibata(Nagasaki Univ.) / Makoto Nagata(Kobe Univ.) / Hideaki Kimata(NTT) / Yutaka Tamiya(Fujitsu Lab.) / / Hiroshi Inoue(Kyushu Univ.) |
Vice Chair | Daisuke Fukuda(Fujitsu Labs.) / Hiroshi Takahashi(Ehime Univ.) / Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Kentaro Sano(RIKEN) / Yoshiki Yamaguchi(Tsukuba Univ.) / Masafumi Takahashi(Toshiba-memory) / Kazuya Kodama(NII) / Keita Takahashi(Nagoya Univ.) |
Secretary | Daisuke Fukuda(Univ. of Aizu) / Hiroshi Takahashi(Hitachi) / Michihiro Koibuchi(Nihon Univ.) / Kota Nakajima(Chiba Univ.) / Kentaro Sano(Nagoya Inst. of Tech.) / Yoshiki Yamaguchi(Hokkaido Univ.) / Masafumi Takahashi(Hiroshima City Univ.) / Kazuya Kodama(e-trees.Japan) / Keita Takahashi(Tohoku Univ.) / (Socionext) / (NTT) / (NHK) |
Assistant | Kazuki Ikeda(Hitachi) / / Eiji Arima(Univ. of Tokyo) / Shugo Ogawa(Hitachi) / Yuuki Kobayashi(NEC) / Hiroki Nakahara(Tokyo Inst. of Tech.) / Tetsuya Hirose(Osaka Univ.) / Koji Nii(Floadia) / Takeshi Kuboki(Kyushu Univ.) / Kyohei Unno(KDDI Research) / Norishige Fukushima(Nagoya Inst. of Tech.) |
Paper Information | |
Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Technical Committee on Image Engineering / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Design of Reference-free CMOS Temperature Sensor with Statistical MOSFET Selection |
Sub Title (in English) | |
Keyword(1) | Temperature sensor |
Keyword(2) | MOSFET |
Keyword(3) | normal distribution |
Keyword(4) | sub-threshold characteristics |
1st Author's Name | Shogo Harada |
1st Author's Affiliation | Kyoto University(Kyoto Univ.) |
2nd Author's Name | Mahfuzul Islam |
2nd Author's Affiliation | Kyoto University(Kyoto Univ.) |
3rd Author's Name | Takashi Hisakado |
3rd Author's Affiliation | Kyoto University(Kyoto Univ.) |
4th Author's Name | Osami Wada |
4th Author's Affiliation | Kyoto University(Kyoto Univ.) |
Date | 2019-11-13 |
Paper # | VLD2019-34,DC2019-58 |
Volume (vol) | vol.119 |
Number (no) | VLD-282,DC-283 |
Page | pp.pp.51-56(VLD), pp.51-56(DC), |
#Pages | 6 |
Date of Issue | 2019-11-06 (VLD, DC) |