| Presentation | 2019-11-13 Improvement of variational autoencoder based test escape detection through image conversion Romain Chicoix, Michihiro Shintani, Kouichi Kumaki, Michiko Inoue, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In testing of large scale integration (LSI) circuit, test escape detection using machine learning algorithms has been attracted attention. More particular, variational autoencoder (VAE) can detect faults that could not be detected by conventional test methods by learning features of fault-free LSIs as random variables. Meanwhile, computer vision is one of the most successful fields in machine learning applications. Inspired by the fact, in this paper, the LSI test data is converted into images, and they are used to improve the detection performance of the outlier detection using a VAE. Through experiments, the proposed approach achieves approximately 2? higher outlier detectability than conventional work. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Outlier detection / Test escape detection / Autoencoder |
| Paper # | VLD2019-31,DC2019-55 |
| Date of Issue | 2019-11-06 (VLD, DC) |
| Conference Information | |
| Committee | VLD / DC / CPSY / RECONF / ICD / IE / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC |
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| Conference Date | 2019/11/13(3days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Ehime Prefecture Gender Equality Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2019 -New Field of VLSI Design- |
| Chair | Nozomu Togawa(Waseda Univ.) / Satoshi Fukumoto(Tokyo Metropolitan Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Yuichiro Shibata(Nagasaki Univ.) / Makoto Nagata(Kobe Univ.) / Hideaki Kimata(NTT) / Yutaka Tamiya(Fujitsu Lab.) / / Hiroshi Inoue(Kyushu Univ.) |
| Vice Chair | Daisuke Fukuda(Fujitsu Labs.) / Hiroshi Takahashi(Ehime Univ.) / Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Kentaro Sano(RIKEN) / Yoshiki Yamaguchi(Tsukuba Univ.) / Masafumi Takahashi(Toshiba-memory) / Kazuya Kodama(NII) / Keita Takahashi(Nagoya Univ.) |
| Secretary | Daisuke Fukuda(Univ. of Aizu) / Hiroshi Takahashi(Hitachi) / Michihiro Koibuchi(Nihon Univ.) / Kota Nakajima(Chiba Univ.) / Kentaro Sano(Nagoya Inst. of Tech.) / Yoshiki Yamaguchi(Hokkaido Univ.) / Masafumi Takahashi(Hiroshima City Univ.) / Kazuya Kodama(e-trees.Japan) / Keita Takahashi(Tohoku Univ.) / (Socionext) / (NTT) / (NHK) |
| Assistant | Kazuki Ikeda(Hitachi) / / Eiji Arima(Univ. of Tokyo) / Shugo Ogawa(Hitachi) / Yuuki Kobayashi(NEC) / Hiroki Nakahara(Tokyo Inst. of Tech.) / Tetsuya Hirose(Osaka Univ.) / Koji Nii(Floadia) / Takeshi Kuboki(Kyushu Univ.) / Kyohei Unno(KDDI Research) / Norishige Fukushima(Nagoya Inst. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Technical Committee on Image Engineering / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improvement of variational autoencoder based test escape detection through image conversion |
| Sub Title (in English) | |
| Keyword(1) | Outlier detection |
| Keyword(2) | Test escape detection |
| Keyword(3) | Autoencoder |
| 1st Author's Name | Romain Chicoix |
| 1st Author's Affiliation | Telecom SudParis(Telecom SudParis) |
| 2nd Author's Name | Michihiro Shintani |
| 2nd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| 3rd Author's Name | Kouichi Kumaki |
| 3rd Author's Affiliation | Renesas Electronics(Renesas Electronics) |
| 4th Author's Name | Michiko Inoue |
| 4th Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
| Date | 2019-11-13 |
| Paper # | VLD2019-31,DC2019-55 |
| Volume (vol) | vol.119 |
| Number (no) | VLD-282,DC-283 |
| Page | pp.pp.13-18(VLD), pp.13-18(DC), |
| #Pages | 6 |
| Date of Issue | 2019-11-06 (VLD, DC) |