Presentation 2019-11-13
On-Chip Leakage Monitor based Temperature Sensor Circuit for Ultra Low Voltage
Daisuke Sato, Kimiyoshi Usami,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The increase in leakage current due to miniaturization is a big problem in devices that require low power consumption. Leakage current increases exponentially with temperature. In order to operate with low power consumption, it is necessary to control the operation mode depending on the temperature.Therefore, a temperature sensor that measures the temperature on the chip is necessary. Sensor nodes and IoT devices are rapidly spreading. Some of these are operated by energy harvesting, but it is difficult for energy harvesting to provide sufficient electromotive force. Some existing circuits use a booster circuit, but the booster circuit consumes a large amount of power. Therefore, there is a demand for a circuit that can operate at an ultra-low voltage without requiring a booster circuit.Therefore, ultra-low voltage operation is required.On-chip leakage monitor based temperature sensor has a problem that the resolution is lowered at a high temperature as compared with a low temperature when operated at an ultra-low voltage. In this paper, we devise a temperature sensor that operates at an ultra-low voltage and has a constant resolution in any temperature range.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Temperature sensor / Ultra low voltage / Leakage monitor
Paper # VLD2019-33,DC2019-57
Date of Issue 2019-11-06 (VLD, DC)

Conference Information
Committee VLD / DC / CPSY / RECONF / ICD / IE / IPSJ-SLDM / IPSJ-EMB / IPSJ-ARC
Conference Date 2019/11/13(3days)
Place (in Japanese) (See Japanese page)
Place (in English) Ehime Prefecture Gender Equality Center
Topics (in Japanese) (See Japanese page)
Topics (in English) Design Gaia 2019 -New Field of VLSI Design-
Chair Nozomu Togawa(Waseda Univ.) / Satoshi Fukumoto(Tokyo Metropolitan Univ.) / Hidetsugu Irie(Univ. of Tokyo) / Yuichiro Shibata(Nagasaki Univ.) / Makoto Nagata(Kobe Univ.) / Hideaki Kimata(NTT) / Yutaka Tamiya(Fujitsu Lab.) / / Hiroshi Inoue(Kyushu Univ.)
Vice Chair Daisuke Fukuda(Fujitsu Labs.) / Hiroshi Takahashi(Ehime Univ.) / Michihiro Koibuchi(NII) / Kota Nakajima(Fujitsu Lab.) / Kentaro Sano(RIKEN) / Yoshiki Yamaguchi(Tsukuba Univ.) / Masafumi Takahashi(Toshiba-memory) / Kazuya Kodama(NII) / Keita Takahashi(Nagoya Univ.)
Secretary Daisuke Fukuda(Univ. of Aizu) / Hiroshi Takahashi(Hitachi) / Michihiro Koibuchi(Nihon Univ.) / Kota Nakajima(Chiba Univ.) / Kentaro Sano(Nagoya Inst. of Tech.) / Yoshiki Yamaguchi(Hokkaido Univ.) / Masafumi Takahashi(Hiroshima City Univ.) / Kazuya Kodama(e-trees.Japan) / Keita Takahashi(Tohoku Univ.) / (Socionext) / (NTT) / (NHK)
Assistant Kazuki Ikeda(Hitachi) / / Eiji Arima(Univ. of Tokyo) / Shugo Ogawa(Hitachi) / Yuuki Kobayashi(NEC) / Hiroki Nakahara(Tokyo Inst. of Tech.) / Tetsuya Hirose(Osaka Univ.) / Koji Nii(Floadia) / Takeshi Kuboki(Kyushu Univ.) / Kyohei Unno(KDDI Research) / Norishige Fukushima(Nagoya Inst. of Tech.)

Paper Information
Registration To Technical Committee on VLSI Design Technologies / Technical Committee on Dependable Computing / Technical Committee on Computer Systems / Technical Committee on Reconfigurable Systems / Technical Committee on Integrated Circuits and Devices / Technical Committee on Image Engineering / Special Interest Group on System and LSI Design Methodology / Special Interest Group on Embedded Systems / Special Interest Group on System Architecture
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On-Chip Leakage Monitor based Temperature Sensor Circuit for Ultra Low Voltage
Sub Title (in English)
Keyword(1) Temperature sensor
Keyword(2) Ultra low voltage
Keyword(3) Leakage monitor
1st Author's Name Daisuke Sato
1st Author's Affiliation Shibaura Institute of Technology(SIT)
2nd Author's Name Kimiyoshi Usami
2nd Author's Affiliation Shibaura Institute of Technology(SIT)
Date 2019-11-13
Paper # VLD2019-33,DC2019-57
Volume (vol) vol.119
Number (no) VLD-282,DC-283
Page pp.pp.45-50(VLD), pp.45-50(DC),
#Pages 6
Date of Issue 2019-11-06 (VLD, DC)