Presentation 2019-10-24
Optical Response Analysis of Mixed Thin Films
Tomohiro Tamaru, Di Wu, Seiya Kishimoto, Yoshito Ashizawa, Katsuji Nakagawa, Shinichiro Ohnuki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Electromagnetic field simulation using mixed thin films in the kretschmann configuration is important for understanding optical response of various media consisted of mixed thin films. In this paper, electromagnetic field analysis of kretschmann arrangement using mixed thin film composed of multiple metallic media is performed, and the structure and numerical model of mixed thin film are studied. The FDFD (Finite-Difference Frequency-Domain) method is used for electromagnetic field analysis. The mixed thin film consisted of multiple metal media are spatially arranged according to the composition ratio and a structure in which a single metal thin film is arranged as a mixed medium, and the analysis results are compared. Optical responses are investigated in terms of reflectivity and plasmon excitation.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Kretschmann Arrangement / Finite-Difference Frequency-Domain Method
Paper # EMCJ2019-44,MW2019-73,EST2019-52
Date of Issue 2019-10-17 (EMCJ, MW, EST)

Conference Information
Committee EMCJ / MW / EST / IEE-EMC
Conference Date 2019/10/24(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Tohoku Gakuin University(Conf. Room 2, Eng. Bldg. 1)
Topics (in Japanese) (See Japanese page)
Topics (in English) EMC, Microwave, Electromagnetic field simulation.
Chair Kensei Oh(Nagoya Inst. of Tech.) / Yoshinori Kogami(Utsunomiya Univ.) / Akimasa Hirata(Nagoya Inst. of Tech.) / Ken-ichi Yamazaki(電中研)
Vice Chair Atsuhiro Nishikata(Tokyo Inst. of Tech.) / Tadashi Kawai(Univ. of Hyogo) / Kensuke Okubo(Okayama Prefectural Univ.) / Shintaro Shinjo(Mitsubishi Electric) / Shinichiro Ohnuki(Nihon Univ.) / Masayuki Kimishima(Advantest) / Jun Shibayama(Hosei Univ.)
Secretary Atsuhiro Nishikata(Tokyo Inst. of Tech.) / Tadashi Kawai(Denso) / Kensuke Okubo(Utsunomiya Univ.) / Shintaro Shinjo(Fujitsu Labs.) / Shinichiro Ohnuki(National Inst. of Tech.,Sendai College) / Masayuki Kimishima(Aoyama Gakuin Univ.) / Jun Shibayama(東北学院大) / (鉄道総研)
Assistant Nami Sasaki(Seiwa Electric MFG) / Hiroyoshi Shida(Tokin EMC Engineering) / Sho Muroga(Akita Univ.) / Satoshi Yoshida(Kagoshima Univ.) / Kyoya Takano(Tokyo Univ. of Science) / Takahiro Ito(Nagoya Inst. of Tech.) / Kazuhiro Fujita(Fujitsu) / Takaaki Ibuchi(阪大)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility / Technical Committee on Microwaves / Technical Committee on Electronics Simulation Technology / Technical Meeting on Electromagnetic Compatibility
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Optical Response Analysis of Mixed Thin Films
Sub Title (in English) Relationship Between Thin Film Structure and Plazmon Excitation in Kretschmann Arrangement
Keyword(1) Kretschmann Arrangement
Keyword(2) Finite-Difference Frequency-Domain Method
1st Author's Name Tomohiro Tamaru
1st Author's Affiliation Nihon University(Nihon Univ)
2nd Author's Name Di Wu
2nd Author's Affiliation Nihon University(Nihon Univ)
3rd Author's Name Seiya Kishimoto
3rd Author's Affiliation Nihon University(Nihon Univ)
4th Author's Name Yoshito Ashizawa
4th Author's Affiliation Nihon University(Nihon Univ)
5th Author's Name Katsuji Nakagawa
5th Author's Affiliation Nihon University(Nihon Univ)
6th Author's Name Shinichiro Ohnuki
6th Author's Affiliation Nihon University(Nihon Univ)
Date 2019-10-24
Paper # EMCJ2019-44,MW2019-73,EST2019-52
Volume (vol) vol.119
Number (no) EMCJ-241,MW-242,EST-243
Page pp.pp.45-48(EMCJ), pp.45-48(MW), pp.45-48(EST),
#Pages 4
Date of Issue 2019-10-17 (EMCJ, MW, EST)