| Presentation | 2019-10-24 A Non-scan Online Test Method Based on n-Time State Transition Coverage Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa, Masayoshi Yoshimura, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | As one of the means to avoid the fault due to the deteriorate over time of VLSI, online test is used to monitor the output of the circuit and the value of the internal signal line in normal operation. Especially for VLSI mounted in automobiles, it is necessary to test in a short time at the same time as starting the engine using a technology called built in self test. The built in self test generally uses a scan design that can obtain a higher fault coverage. On the other hand, the area overhead increases compared to the non scan design. In this paper, we propose a method to improve the fault coverage in non scan design by covering all the state transitions of the controller in the register transfer level circuit more than once by giving the status signal from the memory. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | online test / build-in self-test / non-scan design / register transfer level / design for testability / linear feedback shift register / multiple input shift register |
| Paper # | SS2019-19,DC2019-47 |
| Date of Issue | 2019-10-17 (SS, DC) |
| Conference Information | |
| Committee | DC / SS |
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| Conference Date | 2019/10/24(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kumamoto Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Software Systems, etc. |
| Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) / Akio Nakata(Hiroshima City Univ.) |
| Vice Chair | Hiroshi Takahashi(Ehime Univ.) / Takashi Kobayashi(Tokyo Inst. of Tech.) |
| Secretary | Hiroshi Takahashi(Nihon Univ.) / Takashi Kobayashi(Chiba Univ.) |
| Assistant | / Shinpei Hayashi(Tokyo Inst. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing / Technical Committee on Software Science |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Non-scan Online Test Method Based on n-Time State Transition Coverage |
| Sub Title (in English) | |
| Keyword(1) | online test |
| Keyword(2) | build-in self-test |
| Keyword(3) | non-scan design |
| Keyword(4) | register transfer level |
| Keyword(5) | design for testability |
| Keyword(6) | linear feedback shift register |
| Keyword(7) | multiple input shift register |
| 1st Author's Name | Yuki Ikegaya |
| 1st Author's Affiliation | Nihon University(Nihon Univ.) |
| 2nd Author's Name | Yuta Ishiyama |
| 2nd Author's Affiliation | Nihon University(Nihon Univ.) |
| 3rd Author's Name | Toshinori Hosokawa |
| 3rd Author's Affiliation | Nihon University(Nihon Univ.) |
| 4th Author's Name | Masayoshi Yoshimura |
| 4th Author's Affiliation | Kyoto Sangyo University(Kyoto Sangyo Univ.) |
| Date | 2019-10-24 |
| Paper # | SS2019-19,DC2019-47 |
| Volume (vol) | vol.119 |
| Number (no) | SS-246,DC-247 |
| Page | pp.pp.37-42(SS), pp.37-42(DC), |
| #Pages | 6 |
| Date of Issue | 2019-10-17 (SS, DC) |