Presentation 2019-10-24
A Non-scan Online Test Method Based on n-Time State Transition Coverage
Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa, Masayoshi Yoshimura,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) As one of the means to avoid the fault due to the deteriorate over time of VLSI, online test is used to monitor the output of the circuit and the value of the internal signal line in normal operation. Especially for VLSI mounted in automobiles, it is necessary to test in a short time at the same time as starting the engine using a technology called built in self test. The built in self test generally uses a scan design that can obtain a higher fault coverage. On the other hand, the area overhead increases compared to the non scan design. In this paper, we propose a method to improve the fault coverage in non scan design by covering all the state transitions of the controller in the register transfer level circuit more than once by giving the status signal from the memory.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) online test / build-in self-test / non-scan design / register transfer level / design for testability / linear feedback shift register / multiple input shift register
Paper # SS2019-19,DC2019-47
Date of Issue 2019-10-17 (SS, DC)

Conference Information
Committee DC / SS
Conference Date 2019/10/24(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Kumamoto Univ.
Topics (in Japanese) (See Japanese page)
Topics (in English) Software Systems, etc.
Chair Satoshi Fukumoto(Tokyo Metropolitan Univ.) / Akio Nakata(Hiroshima City Univ.)
Vice Chair Hiroshi Takahashi(Ehime Univ.) / Takashi Kobayashi(Tokyo Inst. of Tech.)
Secretary Hiroshi Takahashi(Nihon Univ.) / Takashi Kobayashi(Chiba Univ.)
Assistant / Shinpei Hayashi(Tokyo Inst. of Tech.)

Paper Information
Registration To Technical Committee on Dependable Computing / Technical Committee on Software Science
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Non-scan Online Test Method Based on n-Time State Transition Coverage
Sub Title (in English)
Keyword(1) online test
Keyword(2) build-in self-test
Keyword(3) non-scan design
Keyword(4) register transfer level
Keyword(5) design for testability
Keyword(6) linear feedback shift register
Keyword(7) multiple input shift register
1st Author's Name Yuki Ikegaya
1st Author's Affiliation Nihon University(Nihon Univ.)
2nd Author's Name Yuta Ishiyama
2nd Author's Affiliation Nihon University(Nihon Univ.)
3rd Author's Name Toshinori Hosokawa
3rd Author's Affiliation Nihon University(Nihon Univ.)
4th Author's Name Masayoshi Yoshimura
4th Author's Affiliation Kyoto Sangyo University(Kyoto Sangyo Univ.)
Date 2019-10-24
Paper # SS2019-19,DC2019-47
Volume (vol) vol.119
Number (no) SS-246,DC-247
Page pp.pp.37-42(SS), pp.37-42(DC),
#Pages 6
Date of Issue 2019-10-17 (SS, DC)