Presentation 2019-08-23
Optical deflector parameter measurement method for high precision of optical deflection technology using wavelength swept light source and diffraction grating
Masahiro Ueno, Yuichi Akage, Souichi Oka,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Swept Source type LiDAR, which has vibration resistance due to the lack of mechanical parts, has attracted attention for applications in environments with vibrations such as automobiles and construction sites. In the LiDAR, light beam is deflected by temporally changing the wavelength incident on the diffraction grating. Therefore, when the deflection unit is formed by the space optical system, it is important to accurately obtain the parameters of the light deflector, such as the incident angle of the light to the grating, the angle between the optical axis of the light deflector and the grating, in order to construct a highly accurate LiDAR. As a parameter acquisition method, we propose a method of fitting position data obtained by capturing deflected light by a photodetector to a grating formula. As a result of using the method, both the incident angle to the grating and the installation angle of the grating can be obtained with an accuracy of 0.1degree or less. In addition, it was confirmed that the accuracy of the deflection angle was an accuracy of 0.03degree or less. This is an error level of about 0.5mm at a distance of up to 1m.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) LiDAR / Swept Source / Diffraction Grating / Accuracy / Light Deflector / Incident Angle / Parameter
Paper # R2019-32,EMD2019-30,CPM2019-31,OPE2019-59,LQE2019-37
Date of Issue 2019-08-15 (R, EMD, CPM, OPE, LQE)

Conference Information
Committee LQE / OPE / CPM / EMD / R
Conference Date 2019/8/22(2days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Hiroshi Aruga(Mitsubishi Electric) / Hiroshi Takahashi(Sophia Univ.) / Mayumi Takeyama(Kitami Inst. of Tech.) / Shinichi Wada(TMC System) / Akira Asato(Fujitsu)
Vice Chair Hiroshi Yasaka(Tohoku Univ.) / Goji Nakagawa(Fujitsu Labs.) / Yuichi Nakamura(Toyohashi Univ. of Tech.) / Yoshiki Kayano(Univ. of Electro-Comm.) / Tadashi Dohi(Hiroshima Univ.)
Secretary Hiroshi Yasaka(Furukawa Electric Industries) / Goji Nakagawa(Osaka Univ.) / Yuichi Nakamura(Tokyo Inst. of Tech.) / Yoshiki Kayano(NTT) / Tadashi Dohi(Hirosaki Univ.)
Assistant Fumito Nakajima(NTT) / Kenta Miura(Gunma Univ.) / Yuki Wakayama(Hitachi) / Yasuo Kimura(Tokyo Univ. of Tech.) / Tomoaki Terasako(Ehime Univ.) / Fumihiko Hirose(Yamagata Univ.) / Yuichi Hayashi(NAIST) / Hiroyuki Okamura(Hiroshima Univ.) / Shinji Yokogawa(Univ. of Electro-Comm.)

Paper Information
Registration To Technical Committee on Lasers and Quantum Electronics / Technical Committee on OptoElectronics / Technical Committee on Component Parts and Materials / Technical Committee on Electromechanical Devices / Technical Committee on Reliability
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Optical deflector parameter measurement method for high precision of optical deflection technology using wavelength swept light source and diffraction grating
Sub Title (in English)
Keyword(1) LiDAR
Keyword(2) Swept Source
Keyword(3) Diffraction Grating
Keyword(4) Accuracy
Keyword(5) Light Deflector
Keyword(6) Incident Angle
Keyword(7) Parameter
1st Author's Name Masahiro Ueno
1st Author's Affiliation Nippon Telegraph and Telephone Corporation(NTT)
2nd Author's Name Yuichi Akage
2nd Author's Affiliation Nippon Telegraph and Telephone Corporation(NTT)
3rd Author's Name Souichi Oka
3rd Author's Affiliation Nippon Telegraph and Telephone Corporation(NTT)
Date 2019-08-23
Paper # R2019-32,EMD2019-30,CPM2019-31,OPE2019-59,LQE2019-37
Volume (vol) vol.119
Number (no) R-169,EMD-170,CPM-171,OPE-172,LQE-173
Page pp.pp.61-66(R), pp.61-66(EMD), pp.61-66(CPM), pp.61-66(OPE), pp.61-66(LQE),
#Pages 6
Date of Issue 2019-08-15 (R, EMD, CPM, OPE, LQE)