| Presentation | 2019-07-24 Potential Method to Extract Uniqueness from Non-Ideality of Sensor Device Thibaut Constant, Makoto Nagata, Noriyuki Miura, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | ISEC2019-60,SITE2019-54,BioX2019-52,HWS2019-55,ICSS2019-58,EMM2019-63 |
| Date of Issue | 2019-07-16 (ISEC, SITE, BioX, HWS, ICSS, EMM) |
| Conference Information | |
| Committee | ISEC / SITE / ICSS / EMM / HWS / BioX / IPSJ-CSEC / IPSJ-SPT |
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| Conference Date | 2019/7/23(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kochi University of Technology |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Security, etc. |
| Chair | Shiho Moriai(NICT) / Tetsuya Morizumi(Kanagawa Univ.) / Hiroki Takakura(NII) / Masaki Kawamura(Yamaguchi Univ.) / Shinichi Kawamura(Toshiba) / Akira Otsuka(IISEC) |
| Vice Chair | Shoichi Hirose(Univ. of Fukui) / Tetsuya Izu(Fujitsu Labs.) / Masaru Ogawa(Kobe Gakuin Univ.) / Takushi Otani(Kibi International Univ.) / Katsunari Yoshioka(Yokohama National Univ.) / Kazunori Kamiya(NTT) / Motoi Iwata(Osaka Prefecture Univ.) / Tetsuya Kojima(NIT,Tokyo College) / Makoto Ikeda(Univ. of Tokyo) / Yasuhisa Shimazaki(Renesas Electronics) / Tetsushi Ohki(Shizuoka Univ.) / Takahiro Aoki(Fujitsu Labs.) |
| Secretary | Shoichi Hirose(NICT) / Tetsuya Izu(Tsukuba Univ.) / Masaru Ogawa(Toyo Eiwa Univ.) / Takushi Otani(KDDI Research) / Katsunari Yoshioka(NICT) / Kazunori Kamiya(KDDI labs.) / Motoi Iwata(NIT, Nagano College) / Tetsuya Kojima(Nagase) / Makoto Ikeda(SECOM) / Yasuhisa Shimazaki(Kyushu Univ.) / Tetsushi Ohki(Univ. of Electro-Comm.) / Takahiro Aoki(SECOM) |
| Assistant | Dai Yamamoto(Fujitsu Labs.) / Yuuji Suga(IIJ) / Nobuyuki Yoshinaga(Yamaguchi Pref Univ.) / Daisuke Suzuki(Hokuriku Univ.) / Keisuke Kito(Mitsubishi Electric) / Toshihiro Yamauchi(Okayama Univ.) / Masaki Inamura(Tokyo Denki Univ.) / Kazuhiro Kono(Kansai Univ.) / / Daishi Watabe(Saitama Inst. of Tech.) / Ryota Horie(Shibaura Inst. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Enriched MultiMedia / Technical Committee on Hardware Security / Technical Committee on Biometrics / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust |
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| Language | ENG-JTITLE |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Potential Method to Extract Uniqueness from Non-Ideality of Sensor Device |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Thibaut Constant |
| 1st Author's Affiliation | Kobe University(Kobe Univ.) |
| 2nd Author's Name | Makoto Nagata |
| 2nd Author's Affiliation | Kobe University(Kobe Univ.) |
| 3rd Author's Name | Noriyuki Miura |
| 3rd Author's Affiliation | Kobe University(Kobe Univ.) |
| Date | 2019-07-24 |
| Paper # | ISEC2019-60,SITE2019-54,BioX2019-52,HWS2019-55,ICSS2019-58,EMM2019-63 |
| Volume (vol) | vol.119 |
| Number (no) | ISEC-140,SITE-141,BioX-142,HWS-143,ICSS-144,EMM-145 |
| Page | pp.pp.389-390(ISEC), pp.389-390(SITE), pp.389-390(BioX), pp.389-390(HWS), pp.389-390(ICSS), pp.389-390(EMM), |
| #Pages | 2 |
| Date of Issue | 2019-07-16 (ISEC, SITE, BioX, HWS, ICSS, EMM) |