Presentation | 2019-06-21 Depth Profiling of Nitrogen Atoms in No-annealed SiO2/4H-SiC Structures Takuji Hosoi, Kidist Moges, Mitsuru Sometani, Takayoshi Shimura, Shinsuke Harada, Heiji Watanabe, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | |
Paper # | SDM2019-25 |
Date of Issue | 2019-06-14 (SDM) |
Conference Information | |
Committee | SDM |
---|---|
Conference Date | 2019/6/21(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Nagoya Univ. VBL3F |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Material Science and Process Technology for MOS Devices and Memories |
Chair | Takahiro Shinada(Tohoku Univ.) |
Vice Chair | Hiroshige Hirano(TowerJazz Panasonic) |
Secretary | Hiroshige Hirano(Shizuoka Univ.) |
Assistant | Takahiro Mori(AIST) / Nobuaki Kobayashi(Nihon Univ.) |
Paper Information | |
Registration To | Technical Committee on Silicon Device and Materials |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Depth Profiling of Nitrogen Atoms in No-annealed SiO2/4H-SiC Structures |
Sub Title (in English) | |
Keyword(1) | |
1st Author's Name | Takuji Hosoi |
1st Author's Affiliation | Osaka University(Osaka Univ.) |
2nd Author's Name | Kidist Moges |
2nd Author's Affiliation | Osaka University(Osaka Univ.) |
3rd Author's Name | Mitsuru Sometani |
3rd Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
4th Author's Name | Takayoshi Shimura |
4th Author's Affiliation | Osaka University(Osaka Univ.) |
5th Author's Name | Shinsuke Harada |
5th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
6th Author's Name | Heiji Watanabe |
6th Author's Affiliation | Osaka University(Osaka Univ.) |
Date | 2019-06-21 |
Paper # | SDM2019-25 |
Volume (vol) | vol.119 |
Number (no) | SDM-96 |
Page | pp.pp.1-4(SDM), |
#Pages | 4 |
Date of Issue | 2019-06-14 (SDM) |