Presentation 2019-03-15
Estimation of dislocation regions in multicrystalline silicon photoluminescence image by transfer learning with convolutional neural network
Hiroaki Kudo, Tetsuya Matsumoto, Kentaro Kutsukake, Noritaka Usami,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In this report, we studied a specified method of regions including dislocations which are crystallographic defects in a photoluminescence (PL) image of multicrystalline silicon wafers. We applied transfer learning of a convolutional neural network to archive it. The network outputs the category which includes dislocation regions or one which does not include them. High accuracies of more than 0.94 are realized. It outperformed methods of multilayer perceptron which has up to 3 hidden layers or of bag of features algorithm as an index by Youden's index. It also obtained better results than the method using non-negative matrix factorization in the condition that the image has larger in depth of learning images in the silicon ingot.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) convolutional neural network / transfer learning / multicrystalline silicon / photoluminescence image / dislocation
Paper # IMQ2018-69,IE2018-153,MVE2018-100
Date of Issue 2019-03-07 (IMQ, IE, MVE)

Conference Information
Committee IMQ / IE / MVE / CQ
Conference Date 2019/3/14(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Kagoshima University
Topics (in Japanese) (See Japanese page)
Topics (in English) media of five senses, multimedia, media experience, picture codinge, image media quality, network,quality and reliability, etc
Chair Kenji Sugiyama(Seikei Univ.) / Takayuki Hamamoto(Tokyo Univ. of Science) / Kenji Mase(Nagoya Univ.) / Takanori Hayashi(Hiroshima Inst. of Tech.)
Vice Chair Toshiya Nakaguchi(Chiba Univ.) / Mitsuru Maeda(Canon) / Hideaki Kimata(NTT) / Kazuya Kodama(NII) / Masayuki Ihara(NTT) / Hideyuki Shimonishi(NEC) / Jun Okamoto(NTT)
Secretary Toshiya Nakaguchi(Nagoya Univ.) / Mitsuru Maeda(Sony) / Hideaki Kimata(KDDI Research) / Kazuya Kodama(Nagoya Univ.) / Masayuki Ihara(NTT) / Hideyuki Shimonishi(Kyushu Univ.) / Jun Okamoto(Nagoya Univ.)
Assistant Masaru Tsuchida(NTT) / Gosuke Ohashi(Shizuoka Univ.) / Kazuya Hayase(NTT) / Yasutaka Matsuo(NHK) / Satoshi Nishiguchi(Oosaka Inst. of Tech.) / Masanori Yokoyama(*) / Chikara Sasaki(KDDI Research) / Yoshiaki Nishikawa(NEC) / Ryo Yamamoto(UEC)

Paper Information
Registration To Technical Committee on Image Media Quality / Technical Committee on Image Engineering / Technical Committee on Media Experience and Virtual Environment / Technical Committee on Communication Quality
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Estimation of dislocation regions in multicrystalline silicon photoluminescence image by transfer learning with convolutional neural network
Sub Title (in English)
Keyword(1) convolutional neural network
Keyword(2) transfer learning
Keyword(3) multicrystalline silicon
Keyword(4) photoluminescence image
Keyword(5) dislocation
1st Author's Name Hiroaki Kudo
1st Author's Affiliation Nagoya University(Nagoya Univ.)
2nd Author's Name Tetsuya Matsumoto
2nd Author's Affiliation Nagoya University(Nagoya Univ.)
3rd Author's Name Kentaro Kutsukake
3rd Author's Affiliation RIKEN(RIKEN)
4th Author's Name Noritaka Usami
4th Author's Affiliation Nagoya University(Nagoya Univ.)
Date 2019-03-15
Paper # IMQ2018-69,IE2018-153,MVE2018-100
Volume (vol) vol.118
Number (no) IMQ-500,IE-501,MVE-502
Page pp.pp.257-262(IMQ), pp.257-262(IE), pp.257-262(MVE),
#Pages 6
Date of Issue 2019-03-07 (IMQ, IE, MVE)