| Presentation | 2019-03-01 Contact reliability of electrical contacts by continuous make/break test of electromagnetic contactor Ikarashi Masanari, Ogaki Asuka, Koichiro Sawa, Kiyoshi Yoshida, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this research, we conducted 5 million times of opening and closing experiments with contacts under minute load conditions (DC 5 V, 3 mA). Then, change in contact resistance was measured. Two pairs of single contacts used for the main circuit and two pairs of twin contacts used as auxiliary contacts were attached to the electromagnetic contactor for the test contacts. Microscope and 3D laser microscope were used for observation of the contact surface after the experiment. Furthermore, 1 million times of opening and closing experiments were conducted to confirm the reproducibility of the experiment. As a result, the change in contact resistance was small in the opening and closing experiment of 5 million times. In both experiments, the contact resistance was as low as several tens mΩ even though it was high, and it was stable low. In one million experiments, experiments were conducted without polishing the surface. As a result, the contact resistance was lower and the contact resistance was lower in the 5 million times experiment with which the surface was polished. It was expected that the effect of initial contact surface condition will be large for micro loads without arc generation. Also, from the observation of the surface of the 3D laser microscope, it was confirmed that the contact surface was consumed due to collision by opening and closing both electrode. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Electrical contact / Electromagnetic contactor / Single contact / Twin contact / Contact resistance / Auxiliary contact |
| Paper # | EMD2018-67 |
| Date of Issue | 2019-02-22 (EMD) |
| Conference Information | |
| Committee | EMD |
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| Conference Date | 2019/3/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Shinichi Wada(TMC System) |
| Vice Chair | Yoshiki Kayano(Univ. of Electro-Comm.) |
| Secretary | Yoshiki Kayano(Muroran Inst. of Tech.) |
| Assistant | Yuichi Hayashi(ＮＡＩＳＴ) |
| Paper Information | |
| Registration To | Technical Committee on Electromechanical Devices |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Contact reliability of electrical contacts by continuous make/break test of electromagnetic contactor |
| Sub Title (in English) | |
| Keyword(1) | Electrical contact |
| Keyword(2) | Electromagnetic contactor |
| Keyword(3) | Single contact |
| Keyword(4) | Twin contact |
| Keyword(5) | Contact resistance |
| Keyword(6) | Auxiliary contact |
| Keyword(7) | |
| 1st Author's Name | Ikarashi Masanari |
| 1st Author's Affiliation | Nippon Institute of Technology(NIT) |
| 2nd Author's Name | Ogaki Asuka |
| 2nd Author's Affiliation | Nippon Institute of Technology(NIT) |
| 3rd Author's Name | Koichiro Sawa |
| 3rd Author's Affiliation | Nippon Institute of Technology(NIT) |
| 4th Author's Name | Kiyoshi Yoshida |
| 4th Author's Affiliation | Nippon Institute of Technology(NIT) |
| Date | 2019-03-01 |
| Paper # | EMD2018-67 |
| Volume (vol) | vol.118 |
| Number (no) | EMD-462 |
| Page | pp.pp.41-46(EMD), |
| #Pages | 6 |
| Date of Issue | 2019-02-22 (EMD) |