Presentation 2019-03-02
An Instrumentation Security Metric for ToF Depth-Image Cameras
Satoru Sakurazawa, Daisuke Fujimoto, Tsutomu Matsumoto,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We are constructing a system for evaluating instrumentation security of ToF Depth-Image Cameras based on pulse-light spoofing. In this paper, we introduce the attack potential rating in vulnerability evaluation of Common Criteria to the system as an instrumentation security metric.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Instrumentation Security / Time of Flight / Depth-Image Camera / Security Evaluation
Paper # VLD2018-141,HWS2018-104
Date of Issue 2019-02-20 (VLD, HWS)

Conference Information
Committee HWS / VLD
Conference Date 2019/2/27(4days)
Place (in Japanese) (See Japanese page)
Place (in English) Okinawa Ken Seinen Kaikan
Topics (in Japanese) (See Japanese page)
Topics (in English) Design Technology for System-on-Silicon, Hardware Security, etc.
Chair Tsutomu Matsumoto(Yokohama National Univ.) / Noriyuki Minegishi(Mitsubishi Electric)
Vice Chair Shinichi Kawamura(Toshiba) / Makoto Ikeda(Univ. of Tokyo) / Nozomu Togawa(Waseda Univ.)
Secretary Shinichi Kawamura(Kobe Univ.) / Makoto Ikeda(SECOM) / Nozomu Togawa(NTT)
Assistant

Paper Information
Registration To Technical Committee on Hardware Security / Technical Committee on VLSI Design Technologies
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An Instrumentation Security Metric for ToF Depth-Image Cameras
Sub Title (in English)
Keyword(1) Instrumentation Security
Keyword(2) Time of Flight
Keyword(3) Depth-Image Camera
Keyword(4) Security Evaluation
1st Author's Name Satoru Sakurazawa
1st Author's Affiliation Yokohama National University(YNU)
2nd Author's Name Daisuke Fujimoto
2nd Author's Affiliation Yokohama National University(YNU)
3rd Author's Name Tsutomu Matsumoto
3rd Author's Affiliation Yokohama National University(YNU)
Date 2019-03-02
Paper # VLD2018-141,HWS2018-104
Volume (vol) vol.118
Number (no) VLD-457,HWS-458
Page pp.pp.283-288(VLD), pp.283-288(HWS),
#Pages 6
Date of Issue 2019-02-20 (VLD, HWS)