| Presentation | 2019-02-27 Note on Target Fault Selection for 2-Pattern Test Generation Considering Critical Area Naoya Uchiyama, Masayuki Arai, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | DC2018-71 |
| Date of Issue | 2019-02-20 (DC) |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2019/2/27(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Vice Chair | Hiroshi Takahashi(Ehime Univ.) |
| Secretary | Hiroshi Takahashi(Tokyo Inst. of Tech.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Note on Target Fault Selection for 2-Pattern Test Generation Considering Critical Area |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Naoya Uchiyama |
| 1st Author's Affiliation | Nihon University(Nihon Univ.) |
| 2nd Author's Name | Masayuki Arai |
| 2nd Author's Affiliation | Nihon University(Nihon Univ.) |
| Date | 2019-02-27 |
| Paper # | DC2018-71 |
| Volume (vol) | vol.118 |
| Number (no) | DC-456 |
| Page | pp.pp.1-5(DC), |
| #Pages | 5 |
| Date of Issue | 2019-02-20 (DC) |