Presentation 2019-02-07
[Invited Talk] Grain-Boundary-Crystallinity Dependence of Mechanical Properties and EM Resistance of Electroplated Copper Interconnections
Yifan Luo, Yutaro Nakoshi, Ryota Mizuno, Ken Suzuki, Hideo Miura,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # SDM2018-94
Date of Issue 2019-01-31 (SDM)

Conference Information
Committee SDM
Conference Date 2019/2/7(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English) Backend / Assembly and Related materials technology
Chair Takahiro Shinada(Tohoku Univ.)
Vice Chair Hiroshige Hirano(TowerJazz Panasonic)
Secretary Hiroshige Hirano(Shizuoka Univ.)
Assistant Takahiro Mori(AIST) / Nobuaki Kobayashi(Nihon Univ.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Invited Talk] Grain-Boundary-Crystallinity Dependence of Mechanical Properties and EM Resistance of Electroplated Copper Interconnections
Sub Title (in English)
Keyword(1)
1st Author's Name Yifan Luo
1st Author's Affiliation Tohoku University(Tohoku Univ.)
2nd Author's Name Yutaro Nakoshi
2nd Author's Affiliation Tohoku University(Tohoku Univ.)
3rd Author's Name Ryota Mizuno
3rd Author's Affiliation Tohoku University(Tohoku Univ.)
4th Author's Name Ken Suzuki
4th Author's Affiliation Tohoku University(Tohoku Univ.)
5th Author's Name Hideo Miura
5th Author's Affiliation Tohoku University(Tohoku Univ.)
Date 2019-02-07
Paper # SDM2018-94
Volume (vol) vol.118
Number (no) SDM-438
Page pp.pp.15-18(SDM),
#Pages 4
Date of Issue 2019-01-31 (SDM)