| Presentation | 2019-02-27 A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki, Masayoshi Yoshimura, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of capture-unsafe test vectors and unsafe faults in an initial test set. Conventional low power oriented X identification methods identified X's such that the number of detected faults for each test vector was almost same. The quality of low power oriented don't care X filling methods depends on the test cube set generated after the application of X-identification. Therefore, it is important to further consider low power consumption of an initial test set at X-identification stage. In this paper, we analyze fault propagation paths for faults in transitive fan-in regions of unsafe faults using randomly generated capture-safe test vectors and propose a low power oriented X identification method mimicking the fault propagation paths under the power consumption constraint. Experimental results for ISCAS'89 and ITC’99 benchmark circuits show that our proposed method reduced the numbers of capture-unsafe test vectors and unsafe fault compared with a conventional low power oriented X-identification method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | capture-safe test vectors / don’t care identification / fault propagation paths / low power testing |
| Paper # | DC2018-73 |
| Date of Issue | 2019-02-20 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2019/2/27(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Vice Chair | Hiroshi Takahashi(Ehime Univ.) |
| Secretary | Hiroshi Takahashi(Tokyo Inst. of Tech.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors |
| Sub Title (in English) | |
| Keyword(1) | capture-safe test vectors |
| Keyword(2) | don’t care identification |
| Keyword(3) | fault propagation paths |
| Keyword(4) | low power testing |
| 1st Author's Name | Kenichiro Misawa |
| 1st Author's Affiliation | Nihon University(Nihon Univ) |
| 2nd Author's Name | Toshinori Hosokawa |
| 2nd Author's Affiliation | Nihon University(Nihon Univ) |
| 3rd Author's Name | Hiroshi Yamazaki |
| 3rd Author's Affiliation | Nihon University(Nihon Univ) |
| 4th Author's Name | Masayoshi Yoshimura |
| 4th Author's Affiliation | Kyouto Sangyo University(Kyouto Sangyo Univ) |
| Date | 2019-02-27 |
| Paper # | DC2018-73 |
| Volume (vol) | vol.118 |
| Number (no) | DC-456 |
| Page | pp.pp.13-18(DC), |
| #Pages | 6 |
| Date of Issue | 2019-02-20 (DC) |