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| Presentation | 2019-01-17 15:25 Effects of bias annealing in normally-off GaN MOS-HFET Takuma Nanjo, Hidetoshi Koyama, Akifumi Imai, Tatsuro Watahiki, Mikio Yamamuka (Mitsubishi Electric) |
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| PDF Download Link |  ED2018-78 MW2018-145 Link to ES Tech. Rep. Archives: ED2018-78 MW2018-145 |
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