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Presentation |
2019-01-18 10:50
Results of EMC round robin test on emission and immunity test.
-- (3) Conducted immunity round robin test -- Yoshitsugu Okuda (KEC Electronic Industry Development Center), Yasushi Asaji (Murata Manufacturing), Takashi Usui (YAMAHA), Mikio Okumura (OMRON), Kazuhiro Kobayashi (IPS), Hiroyoshi Shida (Tokin EMC Engineering), Hisashi Ninomiya (Roland), Mitsuyoshi Maishima (Hamamatsu Photonics), Osami Wada (Kyoto Univ) |
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EMCJ2018-100 |
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