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Presentation |
2018-11-30 13:30
A new method to evaluate the degree of potential fluctuation in InGaN quantum-well laser diodes by optical-pump stimulated-emission measurements Itsuki Oshima, Yuma Ikeda, Shigeta Sakai, A. A. Yamaguchi (Kanazawa Inst. tec.), Yuya Kanitani, Shigetaka Tomiya (Sony) |
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ED2018-49 CPM2018-83 LQE2018-103 Link to ES Tech. Rep. Archives: ED2018-49 CPM2018-83 LQE2018-103 |
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