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| Presentation | 2018-07-19 15:25 A Ka-band GaN Large-Signal Model Considering Trap Effect on Non-linear Capacitance by Using Transient S-parameters Measurement Yutaro Yamaguchi, Tomohiro Otsuka, Masatake Hangai, Shintaro Shinjo (Mitsubishi Electric Corp.), Toshiyuki Oishi (Saga Univ.) |
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| PDF Download Link |  EMT2018-30 MW2018-45 OPE2018-33 EST2018-28 MWP2018-29 Link to ES Tech. Rep. Archives: EMT2018-30 MW2018-45 OPE2018-33 EST2018-28 MWP2018-29 |
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