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2017-12-01 12:55
Improvement of PBTI reliability in GaN-MOSFETs Yosuke Kajiwara, Toshiya Yonehara, Daimotsu Kato, Kenjiro Uesugi, Aya Shindome, Masahiko Kuraguchi, Akira Mukai, Hiroshi Ono, Miki Yumoto, Akira Yoshioka, Shinya Nunoue (Toshiba) |
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ED2017-62 CPM2017-105 LQE2017-75 Link to ES Tech. Rep. Archives: ED2017-62 CPM2017-105 LQE2017-75 |
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