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Presentation |
2017-10-26 14:00
Analysis of Random Telegraph Noise Behaviors toward Changes of Source Follower Transistor Operation Conditions using High Accuracy Array Test Circuit Shinya Ichino, Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Shunichi Wakashima, Shigetoshi Sugawa (Tohoku Univ.) |
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SDM2017-60 Link to ES Tech. Rep. Archives: SDM2017-60 |
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