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| Presentation | 2017-06-20 16:30 Characterization of defects in Ge1-xSnx gate stack structure Yuichi Kaneda, Shinnichi ike, Masayuki Kanematsu, Mitsuo Sakashita, Wakana Takeuchi, Osamu Nakatsuka, Shigeaki Zaima (Nagoya Univ.) |
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| PDF Download Link |  SDM2017-29 Link to ES Tech. Rep. Archives: SDM2017-29 |
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