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Presentation |
2017-01-30 11:30
[Invited Talk]
Fully Coupled 3-D Device Simulation of Negative Capacitance FinFETs for Sub 10 nm Integration Hiroyuki Ota, Tsutomu Ikegami, Junichi Hattori, Koichi Fukuda, Shinji Migita (AIST), Akira Toriumi (The Univ. of Tokyo) |
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SDM2016-133 Link to ES Tech. Rep. Archives: SDM2016-133 |
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