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| Presentation | 2016-12-19 14:40 Effect of Drain-Side Recess Length on DC and RF Characteristics of Cryogenic InP HEMTs Akira Endoh, Issei Watanabe, Akifumi Kasamatsu (NICT), Tsuyoshi Takahashi, Shoichi Shiba, Yasuhiro Nakasha, Taisuke Iwai (Fujitsu Labs.), Takashi Mimura (Fujitsu Labs./NICT) |
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| PDF Download Link |  ED2016-81 Link to ES Tech. Rep. Archives: ED2016-81 |
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