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| Presentation | 2016-06-16 10:10 Automatic Test Pattern Generation for Multiple Stuck-At Faults: When Testing for Single Faults is Insufficient Conrad JinYong Moore, Amir Masoud Gharehbaghi, Masahiro Fujita (Univ. of Tokyo) |
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| PDF Download Link |  CAS2016-3 VLD2016-9 SIP2016-37 MSS2016-3 |
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