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Presentation |
2016-03-22 11:00
An STDP control circuit and its evaluation using a Cu-MoOx-Al resistance change memory fabricated on a Si MOSFET Kazumasa Tomizaki, Takashi Morie, Hideyuki Ando (Kyushu Inst. Tech.), Atsushi Fukuchi, Masashi Arita, Yasuo Takahashi (Hokkaido Univ.) |
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NC2015-70 |
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