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| Presentation | 2006-01-26 15:30 [Invited Talk] Demonstration and application of MOSFET-based single-electron transfer and detection at room temperature -- Fabrication using SOI and measurements of its characteristics -- Katsuhiko Nishiguchi, Yukinori Ono, Akira Fujiwara, Hiroshi Inokawa (NTT), Yasuo Takahashi (Hokkaido Univ.) |
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| PDF Download Link | Link to ES Tech. Rep. Archives:  ED2005-228 SDM2005-240 |
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