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2015-01-16 11:30
Modeling of traps for GaN HEMT by transient response measurement and TCAD simulation Yutaro Yamaguchi, Takuma Nanjo, Hidetoshi Koyama, Yoshitaka Kamo, Koji Yamanaka (Mitsubishi Electric corp.), Toshiyuki Oishi (Saga Univ.) |
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ED2014-129 MW2014-193 Link to ES Tech. Rep. Archives: ED2014-129 MW2014-193 |
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