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| Presentation | 2014-08-05 09:50 Statistical Analysis of Minimum Operation Voltage (Vmin) in Fully Depleted Silicon-on-Thin-BOX (SOTB) SRAM Cells Tomoko Mizutani (Univ. of Tokyo), Yoshiki Yamamoto, Hideki Makiyama, Tomohiro Yamashita, Hidekazu Oda, Shiro Kamohara, Nobuyuki Sugii (LEAP), Toshiro Hiramoto (Univ. of Tokyo) |
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| PDF Download Link |  SDM2014-72 ICD2014-41 Link to ES Tech. Rep. Archives: SDM2014-72 ICD2014-41 |
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