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| Presentation | 2014-08-04 11:15 Testability Improvement for 12.8 GB/s Wide IO DRAM Controller with Small Area Prebonding TSV test and 1GHz Sampled Fully Digital Noise Monitor Takao Nomura, Ryo Mori, Koji Takayanagi, Toshihiko Ochiai, Kazuki Fukuoka, Tsuyoshi Kida, Koji Nii, Sadayuki Morita (REL) |
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| PDF Download Link |  SDM2014-65 ICD2014-34 Link to ES Tech. Rep. Archives: SDM2014-65 ICD2014-34 |
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